Effect of Vanadium on Structure and Morphology of SnO2 Thin Films

Abstract

Tin oxide was prepared by chemical methods and then doped with different weight ratios of vanadium 2wt% and 4wt%. The structural, morphological, and optical properties were studied. It was found that all the recorded films had a polycrystalline diffraction pattern and that the predominant reflection was (111) plane. The doping processes resulted in the improvement of crystalline structure and the disappearance of a number of secondary reflections and the direction of the film in a single crystalline pattern, thus reducing the values of energy gap and percentage transmittance. The morphological properties were studied by converting the three-dimensional images into graphic drawings to enable us to easily calculate surface parameters.

Physical and sensing characterization of nanostructured Ag doped TiO2 thin films

“…[10]. TiO 2 is grown using a variety of processes, such as, CVD [11], ion beam [112], PECVD [13], Plasma spray [14],anodic [15], PLD [16], including thermal [17], sol-gel method [18][19][20], RF sputtering method [20,21] and CSP [22][23][24][25]. The major goal of this research was to use the CSP method to produce undoped and TiO 2 :Ag thin films and explore the doping influence on several physical parameters.…”