“…Compared with the XRD patterns of the prepared DBR substrate, the diffraction peaks locate at 2θ = 17.5 • , 28.0 • , 28.9 • , 31.4 • , 34.9 • , 38.0 • , 40.0 • , 41.9 • , 59.5 • which are not marked in the XRD spectra and simultaneously present in the prepared DBR, CH 3 NH 3 PbBr 3 /NP-GaN DBR and CH 3 NH 3 PbBr 3 /reference substrate are the diffraction peaks of the GaN, sapphire substrate and the GaN epitaxial impurities. The two highest diffraction peaks, located at 34.9 • and 41.9 • , are indexed to GaN (0002) and c-surface sapphire (0006) of the substrate [46]. Figure 5a is the XRD spectra of the CH3NH3PbBr3 crystals grown on the prepared DBR and reference substrates.…”