2012
DOI: 10.1016/j.ultramic.2012.01.009
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Effect of the tip-sample contact force on the nanostructure size fabricated by local oxidation nanolithography

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Cited by 4 publications
(4 citation statements)
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“…Nanotechnology, genetic engineering and intelligent technology are known as the “the most important three techniques of the 21st century”, among which, the rapid development of nanotechnology has brought us to the nano age [1,2,3,4]. Micro/nano manufacturing technology has been widely used in the environment, energy, biology, medicine, national defense and other fields, playing an increasingly important role in promoting national development and social progress [5,6,7,8,9,10,11].…”
Section: Introductionmentioning
confidence: 99%
“…Nanotechnology, genetic engineering and intelligent technology are known as the “the most important three techniques of the 21st century”, among which, the rapid development of nanotechnology has brought us to the nano age [1,2,3,4]. Micro/nano manufacturing technology has been widely used in the environment, energy, biology, medicine, national defense and other fields, playing an increasingly important role in promoting national development and social progress [5,6,7,8,9,10,11].…”
Section: Introductionmentioning
confidence: 99%
“…In the above field-enhanced oxidation, i.e., cathodic oxidation, samples were biased negatively with respect to tips. Sugimura and coworkers [6][7][8] first reported tip-induced anodization technique on Ti films and Si by STM operating in air, in which samples were biased positively compared with tips. They fabricated patterns with resolution better than 30nm by optimizing the conditions.…”
Section: Introductionmentioning
confidence: 99%
“…(a) 两种不同类型的针尖-样品相互作用下AFM针尖位置的示意图; (b) 悬臂相对于样品z位置的典型偏转曲线; (c, d) 施 加到硅表面的直流电压为12 V时, 接触模式(c)和轻敲模式(d)中纵横比与作用力之间的关系[42,44] (网络版彩图) (a) Sketch of the AFM tip position for two different kinds of tip-sample interaction. (b) Typical deflection curve of a cantilever vs. z position of the sample.…”
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“…(b) Typical deflection curve of a cantilever vs. z position of the sample. Relationship between aspect ratio and force in contact mode (c) and tapping mode (d) when a DC voltage of 12 V is applied to the silicon surface[42,44] (color online).距离减小, 使得电场强度明显增加. 此外, 振幅的减小也使得阳极氧化时间和针尖-样品平均接触力增加.…”
mentioning
confidence: 99%