2019
DOI: 10.1016/j.porgcoat.2019.105316
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Effect of the silsesquioxane structure on the mechanical properties of the silsesquioxane-reinforced polymer composite films

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Cited by 15 publications
(9 citation statements)
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“…The measured XRD patterns were similar to the XRD patterns of the POSS mixture and LPSQ [ 58 ]. In addition, EPSQ d-spacing 2 showed a stronger intensity than the XRD data from other studies with similar structures [ 29 ].…”
Section: Resultssupporting
confidence: 57%
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“…The measured XRD patterns were similar to the XRD patterns of the POSS mixture and LPSQ [ 58 ]. In addition, EPSQ d-spacing 2 showed a stronger intensity than the XRD data from other studies with similar structures [ 29 ].…”
Section: Resultssupporting
confidence: 57%
“…The broad diffraction peak at 7.1° indicates the chain-to-chain length (d-spacing 1) of an interdigitated molecule by the side chain of the EPOSS molecule. [ 58 ] The d-spacing (d1) of the EPOSS film was 1.24 nm (λ = 2dsinθ). On the other hand, the broad diffraction peak at 17.5° indicates the average thickness (d-spacing 2) of EPOSS molecules.…”
Section: Resultsmentioning
confidence: 99%
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“…PSQ can be prepared by the hydrolysis and polycondensation of trialkoxysilane, and a coating film can be obtained using a solution process because of its excellent film formability. Therefore, PSQ has been studied in various fields, such as optical materials, gate insulator materials, low-dielectric-constant materials, and scratch-resistant materials. …”
Section: Introductionmentioning
confidence: 99%
“…Pcrit and hcrit data from 5000 μN ramping force nanoscratch tests, performed on PP and PP hybrid composites, are shown in Figure 14 c. The highest Pcrit and hcrit values were obtained for the composite DL, prepared by the dilution of LMB330-1 masterbatch, which is considered to have the best scratch resistance properties [ 52 ].…”
Section: Resultsmentioning
confidence: 99%