2011
DOI: 10.1016/j.apsusc.2010.12.081
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Effect of the incident electron fluence on the electron emission yield of polycrystalline Al2O3

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Cited by 16 publications
(16 citation statements)
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“…The capacitance C was measured in situ thanks to the method described in Ref. 12. For this purpose, V S was set to þ50 V by biasing the sample holder.…”
Section: Methodsmentioning
confidence: 99%
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“…The capacitance C was measured in situ thanks to the method described in Ref. 12. For this purpose, V S was set to þ50 V by biasing the sample holder.…”
Section: Methodsmentioning
confidence: 99%
“…However, measurement of EEY is quite difficult because the charge trapping in the ceramics affects the emission yield itself. [10][11][12] In addition to charging effects, the measurement is made more difficult because the EEY is required for very low incident electron energies (few eV to tens of eV). At low energies, the electron trajectories are highly sensitive to sightless electric or magnetic disturbance.…”
mentioning
confidence: 99%
“…Space charge accumulation and discharge is of great interest both scientifically and technologically [1][2][3][4][5]. There is now a considerable amount of literature concerned with experimental characterization of space charge [6][7][8][9] and with phenomenological models of space charge formation and discharge [10].…”
Section: Introductionmentioning
confidence: 99%
“…Measurements based on a single pulsed electron gun were also reported. [16][17][18][19] Here, the PE energy E pe alternated for negative and positive charging, respectively, for charge compensation, and a Kelvin probe was simultaneously used to detect the potential variation at the sample surface so that positive charges could be effectively neutralized. These charge neutralization approaches are naturally sophisticated and of high cost, in spite of higher accuracy for SEY measurement.…”
mentioning
confidence: 99%
“…6,7 Many efforts have been made for charge neutralization and SEY measurement of insulators. [8][9][10][11][12][13][14][15][16][17][18][19][20] The measurement system with two electron guns could eliminate or weaken charge accumulation. [12][13][14][15] In addition to a pulsed electron gun for SEY measurement, the other low-energy (less than several eV) flood one was used to neutralize positive charges accumulated on the sample surface.…”
mentioning
confidence: 99%