Search for radiation-induced electrical degradation in ion irradiated sapphire and polycrystalline Al 2 O 3 Measurement of carrier lifetime, effective recombination velocity, and diffusion length near the grain boundary using the timedependent electronbeaminduced current
Sodium migration in glasses during electron probe microanalysis is investigated. We observe the change in x-ray emission as a function of time and for various incident electron doses. A specific protocol is used in this study: independently drawn from a multivariate statistical analysis of the data and from an a priori simple model, an exponential decay of the Na signal is clearly established. This model for Na+ migration is only based on an electric field with a linear decrease behavior as a function of depth and it accounts for the main experimental results with no evidence of an incubation time prior to ion migration. The electron densities and the fraction of incident electrons remaining trapped into the glass are deduced from an estimate of ion mobility. The maximum electric field values at the coating/glass interface are also given.
This article deals within the study of the effect of artificial radiations on physical and chemical properties of the crosslinked polyethylene (XLPE) material, widely used for manufacturing high-voltage cables. Within this framework, several experimental tests, using essential characterization techniques, were performed to study XLPE behavior under ultraviolet (UV) aging. Attenuated total reflection Fourier transform infrared spectroscopy, differential scanning calorimetry, thermogravimetric analysis, X-ray diffraction, and scanning electron microscopy were thus carried out to identify the main structure changes of the material before and after exposure to UV. In addition, appearance changes and DC (Direct Current) volume resistivity were evaluated. The obtained results showed that UV radiation has a great effect on the physicochemical properties of XLPE cable insulation.
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