“…Gas sampling through an orifice in the substrate, followed by gas chromatographic or mass spectrometric analysis of the sampled gases, has been used to investigate the chemistry of a wide range of chemical vapor deposition ͑CVD͒ processes. Systems where this technique has been applied include combustion CVD of diamond, 1 hot filament CVD of diamond, 2 atmospheric-pressure radio-frequency plasma CVD of diamond, [3][4][5] microwave plasma CVD of diamond, 6 plasma-enhanced CVD of diamondlike carbon, 7 laser-assisted CVD of germanium, 8 thermal CVD of AlN from ͑͑CH 3 ͒ 2 AlNH 2 ͒ 3 , 9 MOCVD of GaAs, 10,11 photoassisted CVD of Si 3 N 4 , 12 tungsten CVD, 13 and laser-induced CVD of amorphous hydrogenated silicon. 14 In several of these studies, 1,2,4 measured concentrations were explicitly compared to one-dimensional simulations of a chemically reacting stagnation point flow computed using the SPIN code 15 from Sandia National Laboratories.…”