Abstract:Vanadium pentoxide (V 2 O 5 ) thin films have been prepared onto ITO coated flexible Kapton substrates by electron beam evaporation technique. The influence of substrate temperature on the structural, morphological, optical and electrical properties has been investigated. The XRD results reveals that the films prepared at lower temperatures are amorphous in nature and the films prepared at 300 o C is exhibited predominant (001) orientation with an orthorhombic crystal structure. AFM study showed that the grain… Show more
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