2022
DOI: 10.3390/mi13060877
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Effect of Substrate-RF on Sub-200 nm Al0.7Sc0.3N Thin Films

Abstract: Sc-doped aluminum nitride is emerging as a new piezoelectric material which can substitute undoped aluminum nitride (AlN) in radio-frequency MEMS applications, thanks to its demonstrated enhancement of the piezoelectric coefficients. Furthermore, the recent demonstration of the ferroelectric-switching capability of the material gives AlScN the possibility to integrate memory functionalities in RF components. However, its high-coercive field and high-leakage currents are limiting its applicability. Residual str… Show more

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Cited by 8 publications
(7 citation statements)
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“…Article https://doi.org/10.1038/s41467-023-44038-9 a source of performance reduction in acoustic devices, both in terms of Q and k 2 t 50 . To avoid Figure of Merit degradation, deposition conditions must be finely tuned to mitigate AOGs formation, achieve excellent crystallinity, and maintain residual stress levels within the failure tolerance of the suspended plates 46,60,61 .…”
Section: Scaln Thin-film Deposition Optimizationmentioning
confidence: 99%
“…Article https://doi.org/10.1038/s41467-023-44038-9 a source of performance reduction in acoustic devices, both in terms of Q and k 2 t 50 . To avoid Figure of Merit degradation, deposition conditions must be finely tuned to mitigate AOGs formation, achieve excellent crystallinity, and maintain residual stress levels within the failure tolerance of the suspended plates 46,60,61 .…”
Section: Scaln Thin-film Deposition Optimizationmentioning
confidence: 99%
“…In particular, AOGs have been identified as a source performance degradation of microacoustic resonators, both in terms of Q and k 2 t [44]. Because of this, deposition conditions have to be finely tuned to mitigate AOGs formation, achieve excellent crystallinity, and maintain residual stress levels within the failure tolerance of the suspended plates [40] [45] [46].…”
Section: Methodsmentioning
confidence: 99%
“…They investigated the electric field induced inversion domains, as well as the non-switched domains at the bottom electrode interface, providing critical information for understanding the domain evolution process during polarization switching in wurtzite materials. Subsequently, the impact of the nitrogen-to-argon gas ratio and target power ratios, plasma modes, sputter power, deposition temperature, crystal orientation, film stress, surface roughness, Sc content, and deposition rate on ferroelectric properties of ScAlN have been intensively investigated [62,64,[144][145][146][147][148][149][150][151][152][153].…”
Section: Experimental Demonstration Of Ferroelectricity In Nitridesmentioning
confidence: 99%