“…As discussed in [117], these defects alter the electronic transport properties of GNRs and may result in bandgap enhancement if the defect is located near the source region in AGNRFETs, as well as drain current reduction. This is consistent with [99], where a TB P Z orbital model with 3 nearest neighbors is used to calculate the electronic transport properties of an AGNR-FET by means of NEGF coupled with Poisson's Equation, showing that the drain current is significantly reduced for any bias voltage and the I on =I off ratio reduces 2 orders of magnitude. These results are consistent to the calculations presented in [114].…”