2021
DOI: 10.1007/s11082-020-02639-4
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Effect of sputtering power on the properties of SiO2 films grown by radio frequency magnetron sputtering at room temperature

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Cited by 16 publications
(9 citation statements)
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“…The diffractograms of samples A1, A2, B1, and B2 are presented in Figure 5. The Cr 2 O 3 and SiO 2 layers deposited on graphite (C) substrates (ICDD 04-014-0362) show amorphous phase with no specific structural order, as is commonly expected for oxides layers deposited by magnetron sputtering at room temperature [43,44]. For sample A2 the β-W phase (ICDD 00-047-1319) is observed, but the peak corresponding to the (210) diffraction plane has a low intensity with high shift in 2θ position which indicates the formation of a distorted structure.…”
Section: Porositymentioning
confidence: 92%
See 1 more Smart Citation
“…The diffractograms of samples A1, A2, B1, and B2 are presented in Figure 5. The Cr 2 O 3 and SiO 2 layers deposited on graphite (C) substrates (ICDD 04-014-0362) show amorphous phase with no specific structural order, as is commonly expected for oxides layers deposited by magnetron sputtering at room temperature [43,44]. For sample A2 the β-W phase (ICDD 00-047-1319) is observed, but the peak corresponding to the (210) diffraction plane has a low intensity with high shift in 2θ position which indicates the formation of a distorted structure.…”
Section: Porositymentioning
confidence: 92%
“…TDS measurements were used to evaluate the outgassing process of atomic and molecular species trapped on the deposited matrix. In order to conduct the desorption spectra of H 2 O (18), N 2 (28), O 2 (32), and CO 2 (44), configurations deposited on Si substrate (10 × 10 mm 2 ) were investigated under a heating rate of 10 • C/min, while overviewing the difference in desorption at peak temperatures specific to the binding forces between elements and trapping regions. For a better understanding of the TDS spectra, it must be specified that, on the left, desorption signal is plotted as a function of time and on the right, the temperature (C) (red line) as a function of time.…”
Section: Porositymentioning
confidence: 99%
“…13 We also note that thin films of a range of other metal oxide materials are being studied for a variety of applications, including as gate oxides in FET structures. [14][15][16][17] Many alternative techniques have been developed to improve individual aspects of the SiO 2 deposition process, such as sol-gel processes, 18 magnetron sputtering, 19 electron beam deposition, 20 with the most promising being atomic layer deposition (ALD). 21 ALD provides unrivalled step coverages and conformity/uniformity, allowing controllable sub-nanometre thicknesses with pinhole free layers due to the atomic layer by layer growth mechanism.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, there has been increasing interest in the film coating of crystals to protect them from deliquescence, oxidation, and wear . SiO 2 is a conventional thin film material with a broad transparency spectrum, stable chemical properties, and good hardness and wear resistance. , Additionally, considering the refractive index of γ-CuI and the Fresnel theory, SiO 2 has a suitable refractive index (1.467 at 435 nm) for coating γ-CuI while maintaining transparency . Magnetron sputtering is a suitable coating technique owing to its low preparation temperature, high film density, strong film adhesion, and good controllability. Therefore, coating γ-CuI crystals with SiO 2 through magnetron sputtering is expected to significantly improve their luminescence stability by isolating them from air.…”
Section: Introductionmentioning
confidence: 99%
“…17 transparency spectrum, stable chemical properties, and good hardness and wear resistance. 18,19 Additionally, considering the refractive index of γ-CuI and the Fresnel theory, 18 SiO 2 has a suitable refractive index (1.467 at 435 nm) for coating γ-CuI while maintaining transparency. 20 Magnetron sputtering is a suitable coating technique owing to its low preparation temperature, high film density, strong film adhesion, and good controllability.…”
Section: ■ Introductionmentioning
confidence: 99%