2022
DOI: 10.1021/acsami.2c02525
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Effect of Solvent Residue in the Thin-Film Fabrication on Perovskite Solar Cell Performance

Abstract: Organic−inorganic Pb-based halide perovskite photoelectrical materials, especially perovskite solar cells (PSCs), have attracted attention due to the significant efforts in improving the power conversion efficiency (PCE) to above 25%. However, the stability issue of the PSCs restricts their further development for commercialization. Strategies are designed to keep moisture and oxygen out of the perovskite films, such as additive, surface passivation, and solvent engineering; however, usually, the corrosion of … Show more

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Cited by 34 publications
(35 citation statements)
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References 44 publications
(49 reference statements)
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“…[26][27][28][29] The addition of these solvents has been found to be detrimental to the device stability as they can easily be trapped in the films and lead to the formation of voids at the perovskite substrate interface due to their high boiling points and strong coordination ability. [30][31][32][33][34] Although, there is still an ongoing debate in the literature on the impact of these voids with a recent study suggesting that they are not necessarily detrimental to the device stability. 35 By using PbAc 2 as the lead source these problems can be avoided as neither an antisolvent nor the addition of a high-boiling point solvent, such as DMSO or NMP, is required to control the crystallization.…”
Section: Introductionmentioning
confidence: 99%
“…[26][27][28][29] The addition of these solvents has been found to be detrimental to the device stability as they can easily be trapped in the films and lead to the formation of voids at the perovskite substrate interface due to their high boiling points and strong coordination ability. [30][31][32][33][34] Although, there is still an ongoing debate in the literature on the impact of these voids with a recent study suggesting that they are not necessarily detrimental to the device stability. 35 By using PbAc 2 as the lead source these problems can be avoided as neither an antisolvent nor the addition of a high-boiling point solvent, such as DMSO or NMP, is required to control the crystallization.…”
Section: Introductionmentioning
confidence: 99%
“…From the I-V characteristic curve, the F3 sample holds denser and more uniform coatings of materials. e coating thickness and material distribution were clearly identified using the FESEM technique [23][24][25].…”
Section: Resultsmentioning
confidence: 99%
“…The trap-state density is proportional to the trap-filled limit voltage (V TFL ), which is a turning point between the linear Ohmic region and the nonlinear trapfilling region in the current density-voltage curve. [53][54][55] Among three kinds of devices, the device with the ZnO/BCP/Ag multi-layer buffer presented the smallest V TFL value of 0.122 V, corresponding to the lowest trap-state density and minimum of non-radiative recombination. To sum up, the multi-layer buffer facilitated carrier extraction and reduced non-radiative recombination between the electron transport layer and TCO layer, resulting in the performance improvement of ST-PSCs.…”
Section: Papermentioning
confidence: 99%