1995
DOI: 10.1007/bf00679404
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Effect of solution age on the properties of films in the CuO-TiO2 system

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“…The refractive index n, thickness h (LEF-ZM-1 ellipsometer), and mirror-reflection coefficient R (Pulsar spectrocolorimeter) were measured. The chemical stability T was estimated by the decrease in the thickness of the coating after etching in water (30 days) or 0.1 N HCl (30 min) [3]. According to the method used, the chemical stability will be higher the lower the value of T is.…”
mentioning
confidence: 99%
“…The refractive index n, thickness h (LEF-ZM-1 ellipsometer), and mirror-reflection coefficient R (Pulsar spectrocolorimeter) were measured. The chemical stability T was estimated by the decrease in the thickness of the coating after etching in water (30 days) or 0.1 N HCl (30 min) [3]. According to the method used, the chemical stability will be higher the lower the value of T is.…”
mentioning
confidence: 99%