. (2017) 'Extraction of the sub-band gap density of states of Nb doped ZnO thin lm transistors using C-V measurements. ', Microelectronic engineering., Further information on publisher's website:
Use policyThe full-text may be used and/or reproduced, and given to third parties in any format or medium, without prior permission or charge, for personal research or study, educational, or not-for-prot purposes provided that:• a full bibliographic reference is made to the original source • a link is made to the metadata record in DRO • the full-text is not changed in any way The full-text must not be sold in any format or medium without the formal permission of the copyright holders.Please consult the full DRO policy for further details. The sub-band gap density of states (DOS) of Nb doped ZnO thin film transistors were extracted using a multi-frequency capacitance-voltage (C-V) method. The results can be represented by a two-term exponential DOS, representing the tail and deep states. The parameters for the tail and deep states are N tail = 1.6 × 10 19 cm −3 , T tail = 540 K, N deep = 6.5 × 10 16 cm −3 and T deep = 4058 K respectively. Furthermore, the DOS from C-V provides a good fit with current-voltage characteristics, using the multiple trap and release model. Crown