2016
DOI: 10.1016/j.spmi.2015.10.044
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Effect of Se addition on optical and electrical properties of chalcogenide CdSSe thin films

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Cited by 569 publications
(208 citation statements)
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“…Under short circuit current condition (V = 0), the highest recombination occurs at the electrode interfaces due to the charge carrier accumulation as it is shown in Figure 3 (b) leading to lower diffusion length at these positions as shown in Figure 3 According to Eqs. [25,31] It may be noted that for calculating such temperature dependent L D , the temperature dependent recombination rates as given in Eqs. For investigating the influence of temperature on the diffusion length, we have simulated the diffusion length L D in Eq.…”
Section: Resultsmentioning
confidence: 99%
“…Under short circuit current condition (V = 0), the highest recombination occurs at the electrode interfaces due to the charge carrier accumulation as it is shown in Figure 3 (b) leading to lower diffusion length at these positions as shown in Figure 3 According to Eqs. [25,31] It may be noted that for calculating such temperature dependent L D , the temperature dependent recombination rates as given in Eqs. For investigating the influence of temperature on the diffusion length, we have simulated the diffusion length L D in Eq.…”
Section: Resultsmentioning
confidence: 99%
“…Vacuum evaporation technique is the simplest technique used to prepare amorphous thin films especially chalcogenide films such as CdSSe [1], MnS [2], Ge-Te-Ga [3], and so on. In general, chalcogenide materials can be used for memory-switching applications [4,5], phase-change materials [6,7], and solar applications [8].…”
Section: Vacuum Thermal Evaporation Techniquementioning
confidence: 99%
“…It has a Ni-filter and provides a angles were ranged from 4 o to 90 o . These operating parameters allowed to proper examine the samples and detect all possible diffraction peaks [17,26].…”
Section: Structural Investigationmentioning
confidence: 99%
“…It should also be noted here that the nonlinear refractive index (n 2 ) can be determined for each of the crystalline and non-crystalline materials both [54][55][56]. The numerical values of (n 2 ) can be estimated from equation (26). Obviously, the calculated values of (n 2 ) decreased together with increasing annealing power because (n 2 ) is inversely proportional to and E g is increased by increasing the power of the pulsed laser annealing.…”
Section: Nonlinear Optical Analysis and Optical Electronegativitymentioning
confidence: 99%