2015
DOI: 10.1016/j.mssp.2015.05.054
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Effect of porosity on the electrical and photoelectrical properties of textured n+ p silicon solar cells

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Cited by 14 publications
(2 citation statements)
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References 34 publications
(34 reference statements)
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“…It can be observed that the Al/Si+nanoPS+AgNPs/TiO 2 /NiCr device shows the lowest values for τ 1 , τ 2 , and τ 3 , which are associated with increased conduction. The observed increase in τ 1 , τ 2 , and τ 3 for the Al/Si/TiO 2 /NiCr devices is related to the large thickness of the TiO 2 thin films and the large carrier recombination rates of Si [34], as previously indicated in the analysis of the Nyquist plots. The values obtained for τ 1 , τ 2 , and τ 3 for the Al/Si+nanoPS/TiO 2 /NiCr devices are attributed to conduction losses associated with the porous structure of the nanoPS layers, as well as with the formation of defects on their surface [35].…”
Section: Ac Electrical Measurementssupporting
confidence: 70%
“…It can be observed that the Al/Si+nanoPS+AgNPs/TiO 2 /NiCr device shows the lowest values for τ 1 , τ 2 , and τ 3 , which are associated with increased conduction. The observed increase in τ 1 , τ 2 , and τ 3 for the Al/Si/TiO 2 /NiCr devices is related to the large thickness of the TiO 2 thin films and the large carrier recombination rates of Si [34], as previously indicated in the analysis of the Nyquist plots. The values obtained for τ 1 , τ 2 , and τ 3 for the Al/Si+nanoPS/TiO 2 /NiCr devices are attributed to conduction losses associated with the porous structure of the nanoPS layers, as well as with the formation of defects on their surface [35].…”
Section: Ac Electrical Measurementssupporting
confidence: 70%
“…The ECE process was performed to produce three groups of samples by (Yerokhov et al, 2000;Youssef et al, 2015a).…”
Section: Exprimental Detailsmentioning
confidence: 99%