Effect of Nb doping on pyroelectric property of lead zirconate titanate films prepared by chemical solution deposition

Han, Hui; Kotru, Sushma; Zhong, Jiaming; Pandey, R. K.

doi:10.1016/j.infrared.2007.07.005

Cited by 8 publications

(3 citation statements)

References 11 publications

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“…3, and the detailed ferroelectric parameters of PNZT films with PLCT seed layers of different thickness are shown in Table I. From Table I, for the PNZT thin film without seed layer, the coercive field ( E c ) is about 106 kV/cm, and the remnant polarization ( P r ) is about 45 μC/cm 2 , this value is very similar to those of PNZT films reported by most researchers 19,20 . The PNZT thin film with 5‐nM‐thick PLCT seed layer shows higher remnant polarization ( P r =60 μC/cm 2 ) and lower coercive field ( E c =51 kV/cm).…”

Section: Resultssupporting

confidence: 72%

“…From Table I, for the PNZT thin film without seed layer, the coercive field (E c ) is about 106 kV/ cm, and the remnant polarization (P r ) is about 45 mC/cm 2 , this value is very similar to those of PNZT films reported by most researchers. 19,20 The PNZT thin film with 5-nM-thick PLCT seed layer shows higher remnant polarization (P r 5 60 mC/cm 2 ) and lower coercive field (E c 5 51 kV/cm). When the thickness of PLCT seed layer increases to 10 nM, the saturated polarization of the PNZT film is obviously increased, and the remnant polarizations obtained from the hysteresis loop is about 47 mC/ cm 2 .…”

Section: Resultsmentioning

confidence: 99%

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Microstructures and Electric Properties of Highly (111)-Oriented Nb-Doped Pb(Zr0.2,Ti0.8)O3 Films with Pb0.8La0.1Ca0.1Ti0.975O3 Seed Layer

Chi

Fei

2011

Journal of the American Ceramic Society

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A series of highly (111)‐oriented tetragonal Nb‐doped Pb(Zr0.2Ti0.8)O3 (PNZT) films with Pb0.8La0.1Ca0.1Ti0.975O3 (PLCT) seed layers of variant thickness were deposited on the Pt(111)/Ti/SiO2/Si substrates by sol–gel processing. It was found that the PLCT seed layer played a significant role on the microstructures and electrical properties of the PNZT films. The PNZT thin film with 5‐nM‐thick PLCT seed layer displayed enhanced electrical properties such as a large remnant polarization Pr (60 μC/cm2) and a low coercive field Ec (51 kV/cm) at room temperature. The enhancement of electrical properties can be attributed to the rough surface structures of the PLCT seed layer, which offered nucleation sites to reduce the crystallization activation energy of PNZT films and thus facilitated the polarization response. The PLCT seed layer also can act as a capacitive interface layer, reducing or compensating for the vacancy‐type defects of PNZT film effectively, which results in the relatively low current density of PNZT film. These results indicate that the fabricated film is a good candidate for high‐density memories application.

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Section: Resultssupporting

confidence: 72%

Section: Resultsmentioning

confidence: 99%

Microstructures and Electric Properties of Highly (111)-Oriented Nb-Doped Pb(Zr0.2,Ti0.8)O3 Films with Pb0.8La0.1Ca0.1Ti0.975O3 Seed Layer

Chi

Fei

2011

Journal of the American Ceramic Society

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“…One of the most used additives is niobium which substitutes either Zr 4+ or Ti 4+ , promotes the lead vacancies, and is considered as a donor dopant. Most of the studies have reported on the effect of niobium modification on the dielectric, piezoelectric, pyroelectric, and electrooptic properties of PZT in bulk as well as thin film form [18][19][20][21][22][23][24][25]. However, there are so many reports that due to lead evaporation during processing, both doped and undoped PZT, are seldom observed to be perfect [26][27][28].…”

Section: Introductionmentioning

confidence: 99%

Preparation, Structural, Electrical, and Ferroelectric Properties of Lead Niobate–Lead Zirconate–Lead Titanate Ternary System

Gupta

Verma

Singh

et al. 2015

Journal of Ceramics

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A ternary system of lead niobate–lead zirconate–lead titanate with composition xPN–yPZ–(x-y)PT where x=0.5 and y=0.15, 0.25, and 0.35 known as PNZT has been prepared by conventional mixed oxide route at a temperature of 1100°C. The formation of the perovskite phase was established by X-ray diffraction analysis. The surface morphology studied by scanning electron microscopy shows the formation of fairly dense grains and elemental composition was confirmed by energy dispersive X-ray analysis. Dielectric properties like dielectric constant and dielectric loss (ε′ and tan⁡δ) indicate poly-dispersive nature of the material. The temperature dependent dielectric constant (ε′) curve indicates relaxor behaviour with two dielectric anomalies. The poly-dispersive nature of the material was analysed by Cole-Cole plots. The activation energy follows the Arrhenius law and is found to decrease with increasing frequency for each composition. The frequency dependence of ac conductivity follows the universal power law. The ac conductivity analysis suggests that hopping of charge carriers among the localized sites is responsible for electrical conduction. The ferroelectric studies reveal that these ternary systems are soft ferroelectric.

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Coupled Nonlinear Effects in Electroceramics

2018

Fundamentals of Electroceramics

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Effect of Nb doping on pyroelectric property of lead zirconate titanate films prepared by chemical solution deposition

Cited by 8 publications

References 11 publications

Microstructures and Electric Properties of Highly (111)-Oriented Nb-Doped Pb(Zr0.2,Ti0.8)O3 Films with Pb0.8La0.1Ca0.1Ti0.975O3 Seed Layer

Microstructures and Electric Properties of Highly (111)-Oriented Nb-Doped Pb(Zr0.2,Ti0.8)O3 Films with Pb0.8La0.1Ca0.1Ti0.975O3 Seed Layer

Preparation, Structural, Electrical, and Ferroelectric Properties of Lead Niobate–Lead Zirconate–Lead Titanate Ternary System

Coupled Nonlinear Effects in Electroceramics

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