Abstract:A series of highly (111)‐oriented tetragonal Nb‐doped Pb(Zr0.2Ti0.8)O3 (PNZT) films with Pb0.8La0.1Ca0.1Ti0.975O3 (PLCT) seed layers of variant thickness were deposited on the Pt(111)/Ti/SiO2/Si substrates by sol–gel processing. It was found that the PLCT seed layer played a significant role on the microstructures and electrical properties of the PNZT films. The PNZT thin film with 5‐nM‐thick PLCT seed layer displayed enhanced electrical properties such as a large remnant polarization Pr (60 μC/cm2) and a low … Show more
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