Effect of lateral tip stiffness on atomic-resolution force field spectroscopy

Uluutku, Berkin; Baykara, Mehmet Z.

doi:10.1116/1.4807376

Cited by 8 publications

(17 citation statements)

References 23 publications

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“…42 Consequently, it is not always possible to perform straightforward assignments of atomic positions to specific features in data sets that show strong asymmetric features in both data channels.…”

Section: ■ Results and Discussionmentioning

confidence: 99%

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

et al. 2015

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In high-resolution scanning probe microscopy, it is becoming increasingly common to simultaneously record multiple channels representing different tip−sample interactions to collect complementary information about the sample surface. A popular choice involves simultaneous scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) measurements, which are thought to reflect the chemical and electronic properties of the sample surface. With surface-oxidized Cu(100) as an example, we investigate whether atomic-scale information on chemical interactions can be reliably extracted from frequency shift maps obtained while using the tunneling current as the feedback parameter. Ab initio calculations of interaction forces between specific tip apexes and the surface are utilized to compare experiments with theoretical expectations. The examination reveals that constant-current operation may induce a noticeable influence of topography-feedback-induced cross-talk on the frequency shift data, resulting in misleading interpretations of local chemical interactions on the surface. Consequently, the need to apply methods such as 3D-AFM is emphasized when accurate conclusions about both the local charge density near the Fermi level, as provided by the STM channel, and the sitespecific strength of tip−sample interactions (NC-AFM channel) are desired. We conclude by generalizing to the case where multiple atomic-scale interactions are being probed while only one of them is kept constant. ■ INTRODUCTIONWith the accelerating trend toward miniaturization in functional electromechanical systems as well as the advent of twodimensional materials with exceptional physical properties such as graphene 1 and silica bilayers, 2 measuring and understanding chemical surface forces with atomic specificity has become increasingly important for fields as diverse as molecular electronics, catalysis, and tribology. 3 To image and characterize surfaces with atomic resolution, scanning tunneling microscopy (STM) 4 and noncontact atomic force microscopy (NC-AFM) 5 are most frequently used. While STM relies on the tunneling current between an atomically sharp probe tip and a (semi-) conducting sample to deliver atomic scale information about the electronic properties of surfaces, NC-AFM maps how much the resonance frequency f of an oscillating cantilever has changed from its value away from the surface (i.e., from its eigenf requency f 0 ) due to the chemical interaction forces acting between the tip and the sample (corresponding to the f requency shif t, Δf = f − f 0 ). Consequently, the concurrent recording of both the STM and the NC-AFM channel has in principle the potential to yield complementary information on both atomic scale variations in surface interactions and the underlying electronic structure responsible for them. However, using a combination of atomic-scale topography data acquired with tunneling current-based feedback and simultaneously recorded frequency shift images on surface oxidized Cu(100), we sho...

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Section: ■ Results and Discussionmentioning

confidence: 99%

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

et al. 2015

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“…In The distortions associated with the local force fields on Cl − and Na + ions with decreasing tip stiffness can be clearly observed. Image reproduced from [42] particular, repulsive force maxima situated on Na + ions become increasingly narrow with decreasing lateral stiffness and attractive force maxima on top of Cl − ions become significantly wider. Taking into account that atomic-scale force spectroscopy and imaging experiments performed on ionic crystals often feature varying size and shape for the observed force maxima, the relevance of the results presented here in terms of the effect of tip elasticity on 3D force field spectroscopy becomes apparent.…”

Section: Tip Elasticitymentioning

confidence: 99%

“…Despite the remarkable success of NC-AFM in measuring the atomic-scale structure of surfaces as well as associated interaction forces/energies via 3D force field spectroscopy, an important but often overlooked shortcoming of the technique is the inadvertent effect of structural and chemical properties of the tip apex (such as tip asymmetry, elasticity or elemental composition) on acquired data [36,41,42,[48][49][50][51]. Since most tip apices used in 3D force field spectroscopy feature a certain degree of atomic-scale asymmetry at the very apex with respect to the surface due to the methods by which they are obtained, significant inconsistencies arise between different experiments performed on the same sample system by different research groups or even by the same research group on different occasions.…”

Section: Tip Asymmetrymentioning

confidence: 99%

“…Towards this purpose, the interactions between the model sample surface of NaCl(001) and a symmetric Pt tip apex are calculated, using a combination of L-J as well as ionic repulsion and attraction forces. Moreover, the Pt atom at the very end of the tip apex model is taken to carry a positive unit charge and the apex is considered to be connected to the rest of the microscope via a probe tip with a lateral stiffness of k lateral [42].…”

Section: Tip Elasticitymentioning

confidence: 99%

“…Moreover, the technique frequently suffers from various artifacts related to thermal drift and piezo nonlinearities, as well as tip-related issues involving elasticity and asymmetry [41,42]. In this chapter, we will review the advantages and disadvantages of the particular methods proposed in the literature to perform 3D-AFM and analyze the effect of different artifacts on the measurements.…”

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3D Force Field Spectroscopy

Baykara

Schwarz

2015

Noncontact Atomic Force Microscopy

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With recent advances in instrumentation and experimental methodology, noncontact atomic force microscopy is now being frequently used to measure the atomic-scale interactions acting between a sharp probe tip and surfaces of interest as a function of three spatial dimensions, via the method of three-dimensional atomic force microscopy (3D-AFM). In this chapter, we discuss the different data collection and processing approaches taken towards this goal while highlighting the associated advantages and disadvantages in terms of correct interpretation of results. Additionally, common sources of artifacts in 3D-AFM measurements, including thermal drift, piezo nonlinearities, and tip-related issues such as asymmetry and elasticity are considered. Finally, the combination of 3D-AFM with simultaneous scanning tunneling microscopy (STM) is illustrated on surface-oxidized Cu(100). We conclude the chapter by an outlook regarding the future development of the 3D-AFM method.

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Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces

Baykara

2015

Surface Science Tools for Nanomaterials Characterization

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Among the large variety of scanning probe microscopy techniques, noncontact atomic force microscopy (NC-AFM) stands out with its capability of atomicresolution imaging and spectroscopy measurements on conducting, semiconducting as well as insulating sample surfaces. In this chapter, we review the fundamental experimental and instrumental methodology associated with the technique and present key results obtained on different classes of material surfaces. In addition to atomic-resolution imaging, the use of NC-AFM towards the goal of atomic-resolution force spectroscopy is emphasized.

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Effect of lateral tip stiffness on atomic-resolution force field spectroscopy

Cited by 8 publications

References 23 publications

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

3D Force Field Spectroscopy

Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces

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