1996
DOI: 10.1103/physrevb.53.15688
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Effect of interfacial bonding on the structural and vibrational properties of InAs/GaSb superlattices

Abstract: We have studied InAs/GaSb superlattices (SLs) grown with either InSb-like or GaAs-like interfaces (IFs) on top of a GaSb buffer layer on (100) GaAs substrates. The InAs layer thickness was varied from 4 to 14 monolayers (ML) while the GaSb layer thickness was kept fixed at 10 ML. The type of IF bonds realized was verified by Raman scattering from mechanical IF modes. High-resolution X-ray diffraction using one- and two-dimensional mapping of symmetric and asymmetric reflections allowed us to determine independ… Show more

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Cited by 90 publications
(62 citation statements)
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“…[17][18][19][20][21][22][23][24] Most of them were performed in the (001) back-scattering geometry, with only one major Raman peak observed at around 236 238cm -1 assigned generally as a SL-LO mode. It was believed that the overlapping of the bulk phonon modes would make it difficult to resolve the confined and extended modes.…”
mentioning
confidence: 99%
“…[17][18][19][20][21][22][23][24] Most of them were performed in the (001) back-scattering geometry, with only one major Raman peak observed at around 236 238cm -1 assigned generally as a SL-LO mode. It was believed that the overlapping of the bulk phonon modes would make it difficult to resolve the confined and extended modes.…”
mentioning
confidence: 99%
“…Based on the theoretical modeling and simulation we chose the optimum structure for a room temperature detector at λ = 11 µm. The structure consisted of a 2 µm superlattice with 48Å InAs, 30Å GaSb, and one monolayer of InSb at the interfaces as it is shown to improve the optical and electrical quality of the superlattice [68]. Finally, the superlattice was capped with a thin 200Å GaSb layer.…”
mentioning
confidence: 99%
“…A more precise evaluation has been carried out based on the Williamson-Hall evaluation method (Williamson & Hall, 1953;Herres et al, 1996;Kirste et al, 2005), as described by Durand et al (2011b). Herres and co-workers attributed the line profile broadening to three mechanisms: the tilt, the average crystallite size and the inhomogeneous strain.…”
Section: Wr and Smentioning
confidence: 99%