2013
DOI: 10.1016/j.jallcom.2013.04.140
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Effect of interface morphology on intermetallics formation upon annealing of Al–Ni multilayer

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Cited by 24 publications
(12 citation statements)
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“…Thus for estimation of the stoichiometry of alloy layer we have compared ϕ n (z) obtained from PNR and ϕ x (z) obtained from XRR data with theoretical value of SLD. 19,22 We obtained the stoichiometry of the alloy layer formed at the interface to be NiGe (mono germanide), which corroborates the GIXRD data. We obtained very small magnetic moment density (∼30% of the bulk Ni) for Ni layers in the as-deposited sample from PNR measurements.…”
Section: Resultssupporting
confidence: 81%
See 1 more Smart Citation
“…Thus for estimation of the stoichiometry of alloy layer we have compared ϕ n (z) obtained from PNR and ϕ x (z) obtained from XRR data with theoretical value of SLD. 19,22 We obtained the stoichiometry of the alloy layer formed at the interface to be NiGe (mono germanide), which corroborates the GIXRD data. We obtained very small magnetic moment density (∼30% of the bulk Ni) for Ni layers in the as-deposited sample from PNR measurements.…”
Section: Resultssupporting
confidence: 81%
“…26 Using XRR and PNR together we identified the interface alloy stoichiometry as reported earlier for the binary systems. 19,22 Surface morphology of the as deposited and annealed samples at 250 • C for 4 h has been quantified in terms of fractal parameters 27,28 of height difference correlation function. The AFM data were collected on samples of 2×2 µm 2 size using a 'Solver P47H' microscope.…”
Section: Experimental and Data Analysismentioning
confidence: 99%
“…The PNR data were collected at DHRUVA reactor, India [17]. XRR and PNR are non-destructive tools which provide density profile as a function of depth with nanometer resolutions [18][19][20][21][22]. PNR data allowed us to obtain the nuclear scattering length densities (NSLD) depth profile in the samples and XRR data was used to obtain electron scattering length densities (ESLD).…”
Section: Methodsmentioning
confidence: 99%
“…The dissipation of heat through the wire substrates is not as effective as in flat substrates in full contact with the copper substrate-holder. This might be the cause of the presence of "overheated" areas that, in combination with the low reaction temperatures of Ni/Al nanoscale multilayers [15,16], could already locally promote limited reaction during deposition.…”
Section: As-deposited Filmsmentioning
confidence: 99%