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2019
DOI: 10.1017/s1431927619000667
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Effect of Heavy Mass Ion (Gold) and Light Mass Ion (Boron) Irradiation on Microstructure of Tungsten

Abstract: The difference in the defect structures produced by different ion masses in a tungsten lattice is investigated using 80 MeV Au7+ ions and 10 MeV B3+ ions. The details of the defects produced by ions in recrystallized tungsten foil samples are studied using transmission electron microscopy. Dislocations of type b = 1/2[111] and [001] were observed in the analysis. While highly energetic gold ion produced small clusters of defects with very few dislocation lines, boron has produced large and sparse clusters with… Show more

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Cited by 4 publications
(6 citation statements)
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“…Mechanically polished samples of 8 × 8 × 0.1 mm 3 size were annealed at 1838 K for about 50 min in a vacuum furnace at a base pressure of 0.1 Pa. The annealing was carried out in an inert environment of 10 4 Pa Ar + 8% H 2 gas to prevent the surface oxidation of tungsten at high temperature [51]. The samples were mechanically polished before annealing and were characterized using x-ray diffraction (XRD), four-probe resistivity measurements, PAS and transmission electron microscopy (TEM) both before and after annealing.…”
Section: Sample Preparationmentioning
confidence: 99%
“…Mechanically polished samples of 8 × 8 × 0.1 mm 3 size were annealed at 1838 K for about 50 min in a vacuum furnace at a base pressure of 0.1 Pa. The annealing was carried out in an inert environment of 10 4 Pa Ar + 8% H 2 gas to prevent the surface oxidation of tungsten at high temperature [51]. The samples were mechanically polished before annealing and were characterized using x-ray diffraction (XRD), four-probe resistivity measurements, PAS and transmission electron microscopy (TEM) both before and after annealing.…”
Section: Sample Preparationmentioning
confidence: 99%
“…Both TEM and XRD analysis confirm the re-crystallization of the samples with highly textured grains oriented along [200]. The grain size of the RC1 samples varied between 25 μm to 40 μm [19] and that of the RC2 samples varied between 25 μm to 150 μm. The open volume defects in the samples were characterized using positron lifetime spectroscopy (PALS) using a 22 Na positron source sandwiched between two identical W samples.…”
Section: Sample Preparation and Characterizationmentioning
confidence: 70%
“…TEM analysis of the samples has also shown extensive dislocation formation in the Au-and B-irradiated samples. We observed dislocation lines, loops and clusters in the BLF, BHF and Au-irradiated samples [16,19]. We found dislocations of edge, screw and mixed types with the majority being the mixed type (66%) in Au-irradiated samples and of the screw type in B-irradiated samples (44%).…”
Section: Defect Analysis Using Pals and Temmentioning
confidence: 84%
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“…Figure 2 showed SRIM simulation calculation of 2.7 MeV Si 2+ ion implantation into pure tungsten that reached peak damage of 100 dpa using the model of Ion Distribution and Quick Calculation of Damage [ 30 ], and displacement energy of 90 eV [ 31 ], a total of 100,000 ions simulation were performed. The dose rate at different depths could be simulated by dividing the dose by the total irradiation time, as a result the dose rate corresponding to the damage peak was 1.2 × 10 −3 dpa/s.…”
Section: Methodsmentioning
confidence: 99%