2003
DOI: 10.1016/s0022-0248(02)01831-6
|View full text |Cite
|
Sign up to set email alerts
|

Effect of growth temperature on C-doped InAlAs layers grown by LP-MOVPE

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2004
2004
2005
2005

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 13 publications
0
1
0
Order By: Relevance
“…In early work on C-InAlAs, Ito and Ougazzaden used the extremely low growth temperature (T g ) of 530 1C [7,8]. Following this, several groups [9,10] have investigated the electrical characteristics of the C-InAlAs and found that a low T g (o575 1C) is necessary to keep the ptype carrier concentration. We have also demonstrated that the carbon concentration increases with decrease in T g , and have successfully achieved a p-doping over 1 Â 10 18 cm À3 at the higher T g of 580 1C [11].…”
Section: Introductionmentioning
confidence: 99%
“…In early work on C-InAlAs, Ito and Ougazzaden used the extremely low growth temperature (T g ) of 530 1C [7,8]. Following this, several groups [9,10] have investigated the electrical characteristics of the C-InAlAs and found that a low T g (o575 1C) is necessary to keep the ptype carrier concentration. We have also demonstrated that the carbon concentration increases with decrease in T g , and have successfully achieved a p-doping over 1 Â 10 18 cm À3 at the higher T g of 580 1C [11].…”
Section: Introductionmentioning
confidence: 99%