Abstract:Blue light-emitting diodes (LED's), utilizing InGaN-based multi-quantum well (MQW) active regions deposited by organometallic chemical vapor epitaxy (OMVPE), are one of the fundamental building-blocks for current solid-state lighting applications. Studies [1,2] have previously been conducted to explore the optical and physical properties of the active MQW's over a variety of different OMVPE growth conditions. However, the conclusions of these papers have often been contradictory, possibly due to a limited data… Show more
“…Since the carrier life-time (τ) is calculated by 1/τ = 1/τ r + 1/τ nr , [5] it is predominantly affected by the smaller life-time. Consequently, as the temperature increases from 10 K to 70 K, the radiative recombination life-time increases, leading to larger carrier life-time.…”
Section: Resultsmentioning
confidence: 99%
“…Detailed growth conditions are described elsewhere. 5 The growth temperature was also tuned to achieve a target PL peak wavelength of ∼449 nm, corresponding to an indium composition of ∼14%. Figure 1 shows the system diagram of low-temperature PL system.…”
Carrier localization, transportation and recombination in blue-emitting InGaN/GaN multiple quantum wells were analyzed using temperature-dependent photoluminescence spectroscopy, confocal laser scanning microscopy and time-resolved photoluminescence (TRPL). The temperature-dependent shift of PL intensity was fitted with Arrhenius equation and explained using two non-radiative channels, which are related with thermal activation of carriers from different confining potentials. The S-shaped shift of PL peak energy and inverse-S-shaped shift of PL full width at half maximum were explained with carrier localization and carrier transportation. The TRPL spectra taken at several different places from bright region to dark region in the confocal microscopic image showed that the fast decay life-time τ 1 increases with decreasing PL intensity, indicating a higher carrier transportation rate at bright region, while the slow decay life-time τ 2 decreases with decreasing PL intensity, indicating a higher probability of non-radiative recombination at dark region. 2 Previous research has been focused on studying the carrier localization effect in potential minimum using transmission electron microscopy, 3 nearfield scanning optical microscopy. 4 However, not too much work has been focused on the carrier transportation between different regions in the QW layer. In the present work, temperature-dependent photoluminescence (PL), confocal laser scanning microscopy (CLSM) and time-resolved photoluminescence (TRPL) are utilized to analyze the carrier localization and transportation behavior.
ExperimentalTwo InGaN/GaN MQWs samples were grown on c-plane sapphire substrate in a Veeco K465i GaN metal-organic chemical vapor deposition (MOCVD) reactor. Triethylgallium (TEGa) and trimethylindium (TMIn) were used as group III sources. Ammonia (NH 3 ) was used as group V source. Nitrogen was used as carrier gas. A 30-nm-thick GaN nucleation layer was grown first on the substrate, followed by a 0.5-μm-thick GaN buffer layer and a 2-μm-thick Si-doped n-type GaN layer. This preliminary structure serves as a GaN template for further growth. Analysis of the GaN template is as follow. The X-ray diffraction (XRD) ω(002) and ω(102) rocking curves scan indicated a TD density of approximately 4.4 × 10 8 cm −2 . The atomic force microscopy (AFM) surface morphology scan of the GaN template in a 5 × 5 μm 2 area exhibited a root mean square (RMS) roughness of 0.4 nm. Four-period MQWs were then grown on the GaN template, consisting of 2.7-nm-thick InGaN quantum well layers and 12.5 nm-thick GaN barrier layers, as was confirmed by XRD. Detailed growth conditions are described elsewhere. 5 The growth temperature was also tuned to achieve a target PL peak wavelength of ∼449 nm, corresponding to an indium composition of ∼14%. Figure 1 shows the system diagram of low-temperature PL system. A Verdi-G10-semiconductor-laser pumped laser system, generating 400 nm CW laser beam, was used as excitation source. The laser beam, after transmitting through an optical fib...
“…Since the carrier life-time (τ) is calculated by 1/τ = 1/τ r + 1/τ nr , [5] it is predominantly affected by the smaller life-time. Consequently, as the temperature increases from 10 K to 70 K, the radiative recombination life-time increases, leading to larger carrier life-time.…”
Section: Resultsmentioning
confidence: 99%
“…Detailed growth conditions are described elsewhere. 5 The growth temperature was also tuned to achieve a target PL peak wavelength of ∼449 nm, corresponding to an indium composition of ∼14%. Figure 1 shows the system diagram of low-temperature PL system.…”
Carrier localization, transportation and recombination in blue-emitting InGaN/GaN multiple quantum wells were analyzed using temperature-dependent photoluminescence spectroscopy, confocal laser scanning microscopy and time-resolved photoluminescence (TRPL). The temperature-dependent shift of PL intensity was fitted with Arrhenius equation and explained using two non-radiative channels, which are related with thermal activation of carriers from different confining potentials. The S-shaped shift of PL peak energy and inverse-S-shaped shift of PL full width at half maximum were explained with carrier localization and carrier transportation. The TRPL spectra taken at several different places from bright region to dark region in the confocal microscopic image showed that the fast decay life-time τ 1 increases with decreasing PL intensity, indicating a higher carrier transportation rate at bright region, while the slow decay life-time τ 2 decreases with decreasing PL intensity, indicating a higher probability of non-radiative recombination at dark region. 2 Previous research has been focused on studying the carrier localization effect in potential minimum using transmission electron microscopy, 3 nearfield scanning optical microscopy. 4 However, not too much work has been focused on the carrier transportation between different regions in the QW layer. In the present work, temperature-dependent photoluminescence (PL), confocal laser scanning microscopy (CLSM) and time-resolved photoluminescence (TRPL) are utilized to analyze the carrier localization and transportation behavior.
ExperimentalTwo InGaN/GaN MQWs samples were grown on c-plane sapphire substrate in a Veeco K465i GaN metal-organic chemical vapor deposition (MOCVD) reactor. Triethylgallium (TEGa) and trimethylindium (TMIn) were used as group III sources. Ammonia (NH 3 ) was used as group V source. Nitrogen was used as carrier gas. A 30-nm-thick GaN nucleation layer was grown first on the substrate, followed by a 0.5-μm-thick GaN buffer layer and a 2-μm-thick Si-doped n-type GaN layer. This preliminary structure serves as a GaN template for further growth. Analysis of the GaN template is as follow. The X-ray diffraction (XRD) ω(002) and ω(102) rocking curves scan indicated a TD density of approximately 4.4 × 10 8 cm −2 . The atomic force microscopy (AFM) surface morphology scan of the GaN template in a 5 × 5 μm 2 area exhibited a root mean square (RMS) roughness of 0.4 nm. Four-period MQWs were then grown on the GaN template, consisting of 2.7-nm-thick InGaN quantum well layers and 12.5 nm-thick GaN barrier layers, as was confirmed by XRD. Detailed growth conditions are described elsewhere. 5 The growth temperature was also tuned to achieve a target PL peak wavelength of ∼449 nm, corresponding to an indium composition of ∼14%. Figure 1 shows the system diagram of low-temperature PL system. A Verdi-G10-semiconductor-laser pumped laser system, generating 400 nm CW laser beam, was used as excitation source. The laser beam, after transmitting through an optical fib...
“…Detailed growth conditions are described elsewhere. 15 In this case, the MQW structures were close to exactly the same such that QCSE and strain-related internal electric fields were considered not to be a major influence in the run-to-run comparison. The growth temperature was also tuned to achieve a target PL peak wavelength of ∼449 nm, corresponding to the indium composition of ∼14%.…”
Section: Methodsmentioning
confidence: 88%
“…It is conceivable that samples grown at higher pressure may have fewer point defect and vacancies, and as a result, better crystal quality. 15 The bright region average intensity was calculated over 10 × 10 pixels in the bright region of the CLSM image. Figure 2d shows the bright region average PL intensity as a function of the PL peak energy difference.…”
Confocal laser scanning microscopy and time-resolved photoluminescence (TRPL) spectroscopy were used to study blue-emitting InGaN/GaN multiple quantum wells. Spatial and spectral variations of photoluminescence (PL) were observed over submicron-scale regions. Spectral measurements showed that the bright regions have a higher PL intensity as well as smaller peak energy than the dark regions. Correlations among the bright region-dark region PL peak energy difference, the average PL intensity, the PL FWHM, the bright region PL intensity, and the extent of PL intensity fluctuation were observed. As the energy difference increased, the average PL intensity, the PL FWHM, and the bright region PL intensity increased, with a higher degree of areal PL intensity fluctuations. TRPL measurements and calculations showed that the effective PL lifetime at bright regions was longer than that at dark regions, and bright region lifetime increases as energy difference increases, possibly as a result of stronger confinement.
“…Four-period MQWs were then grown on the GaN template, consisting of 2.7-nm-thick InGaN quantum well layers and 12.5 nm-thick GaN barrier layers, as was confirmed by XRD. Detailed growth conditions are described elsewhere (5). The growth temperature was also tuned to achieve a target PL peak wavelength of ~449 nm, corresponding to an indium composition of ~14%.…”
Carrier localization, transportation and recombination in blueemitting InGaN/GaN multiple quantum wells were analyzed using temperature-dependent photoluminescence spectroscopy, confocal laser scanning microscopy and time-resolved photoluminescence (TRPL). The temperature-dependent shift of PL intensity was fitted with Arrhenius equation and explained using two nonradiative channels, which are related with thermal activation of carriers from different confining potentials. The S-shaped shift of PL peak energy and inverse-S-shaped shift of PL full width at half maximum were explained with carrier localization and carrier transportation. The TRPL spectra taken at several different places from bright region to dark region in the confocal microscopic image showed that the fast decay lifetime τ 1 increases with decreasing PL intensity, indicating a higher carrier transportation rate at bright region, while the slow decay lifetime τ 2 decreases with decreasing PL intensity, indicating a higher probability of non-radiative recombination at dark region.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.