2011
DOI: 10.1016/j.tsf.2011.01.327
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Effect of filament temperature and deposition time on the formation of tungsten silicide with silane

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Cited by 10 publications
(15 citation statements)
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“…Similar growth behavior was observed in many other deposition studies. 9,10,19,27,35,36 In the first stage of deposition (up to 3 h), the corresponding diffusion coefficient was determined to be 6.8 × 10 -16 m 2 s -1 , which is close to the diffusion coefficient of carbon in W 2 C reported in the literature. 37 In the second stage, between 3 and 6 h, 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 involved a hydrogen elimination to form a cyclic silylene intermediate, 1,3-disilacyclobut-1-ylidene (I), which quickly inserted into the Si-H bond of the parent DSCB molecule to form 1,1'-bis(1,3-disilacyclobutane) (route a in Scheme 1).…”
Section: Resultssupporting
confidence: 82%
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“…Similar growth behavior was observed in many other deposition studies. 9,10,19,27,35,36 In the first stage of deposition (up to 3 h), the corresponding diffusion coefficient was determined to be 6.8 × 10 -16 m 2 s -1 , which is close to the diffusion coefficient of carbon in W 2 C reported in the literature. 37 In the second stage, between 3 and 6 h, 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 involved a hydrogen elimination to form a cyclic silylene intermediate, 1,3-disilacyclobut-1-ylidene (I), which quickly inserted into the Si-H bond of the parent DSCB molecule to form 1,1'-bis(1,3-disilacyclobutane) (route a in Scheme 1).…”
Section: Resultssupporting
confidence: 82%
“…In the deposition of Si films using SiH 4 , the growth of a silicide layer on the W or Ta filament was commonly observed. 6,7,9 Recently, our laboratory has studied the structural changes in W wires when they are exposed to different four-membered-ring (di)silacyclobutane molecules, including 1-silacyclobutane (SCB) 8 and 1,1,3,3-tetramethyl-1,3-disilacyclobutane (TMDSCB). 12,20 These organosilicon compounds are potentially useful single-source precursor gases to replace the SiH 4 /hydrocarbon mixtures that are conventionally used for silicon carbide thin film deposition by Cat-CVD.…”
Section: Introductionmentioning
confidence: 99%
“…However, W filaments suffer from a short lifetime, especially at lower filament temperatures. [15][16][17][18] In contrast, a Ta filament lasts longer since it is less prone to form silicides on its surface. 19,20 Despite this advantage, little is known about the gas-phase chemistry when using these precursor molecules with Ta as a filament.…”
Section: Introductionmentioning
confidence: 99%
“…To date, W and Ta metal wires have been the most commonly used catalysts [8][9][10][11]. However, the catalyst surface is easily converted to silicide during the reaction [12][13][14][15][16], which leads to a lower deposition rate for the film due to deactivation of the catalyst [17]. Worse still, quality of the prepared Si film declines with the duration of the reaction [17][18][19].…”
Section: Introductionmentioning
confidence: 99%