Effect of Fe-doping on the structural and optical properties of ZnO thin films prepared by spray pyrolysis

Abstract

Fe-doped ZnO thin films have been prepared by spray pyrolysis on glass substrates and the influence of Fe-doping concentration on the structural and optical properties of the films has been studied. The X-ray diffraction (XRD) analysis shows that Fe doping has a significant effect on crystalline quality, grain size and strain in the thin films. The best crystalline structure is obtained for 3 at% Fe doping as observed from scanning electron microscopy (SEM) and XRD. However, lower or higher Fe-doping degrades the crystalline quality in turn. Moreover, UV spectroscopy demonstrates the influence of Fe-incorporation on visible range transmittance of ZnO where the best transmittance is obtained for 3 at% doping. The results have been illustrated simultaneously focusing previous results obtained from literature.

Shape-controlled magnetic nanoplatelets of Ni-doped ZnO synthesized via a chemical precursor

“…Table 1 [10,70,71]. Similar trends in the d hklspacings and lattice constants were also observed by Elilarassi et al [10].…”

Structural, optical and electronic properties of Fe doped ZnO thin films

“…From the pattern, it is clear that deposited films were in single phase, highly oriented along c-axis and maintains wurtzite crystalline symmetry. Lattice parameter 'c' and lower boundary grain size 'D' was calculated using Bragg's law and Scherer formula, as shown in equation (1) and (2) respectively [20][21].…”

“…But very few reports were present on optical properties of Fe, Co and Ni doped ZnO [13][14]. For the fabrication of quantum well device, band tailoring property plays a major role.…”

Growth and effect of deposition pressure on microstructure and electrical properties of 3C-SiC thin films deposited using methyltrichlorosilane single precursor

“…The peaks corresponding to 6H-SiC (101) polytype, 3C-SiC (311) and 3C-SiC (111) are observed in the film deposited at a pressure of 1.5 mbar. The The dislocation density (δ ), defined as the length of dislocation lines per unit volume [15], are estimated using the equation…”