Effect of Annealing and Deposition Temperature on Structural Properties of Cdte Thin Films Prepared by Thermal Evaporation Method

Hussein, Mustafa Mohammed Ali; Abdullah, Manal Midhat; Mohammed, Ghuson H.

doi:10.15373/2249555x/feb2013/110

Cited by 4 publications

(2 citation statements)

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“…No other peak beside these is observed which establishes the single phase cubic structure of the films. All peaks reflected in the XRD patterns are in good agreement with the standard (cubic) JCPDS (75-2086) values (Hussein et al, 2013). The (111) direction is the close packing direction of the zinc blende structure and this type of formation is often observed in polycrystalline films ( Singh et.al., 2010, Abdul et al, 2009, Shaaban et al 2009 grown on heated amorphous substrates.…”

Section: Figure 4: Variation Of Extinction Coefficient At Different Tsupporting

confidence: 76%

Preparation of CdTe Nuclear Detector Material in Thin Film Form using Thermal Evaporation Method

Hussain¹,

Faruqe²,

Parvin³

et al. 2017

Malays. j. med. biol. res.

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A study is initiated about cadmium telluride (CdTe) materials deposition and characterization for radiation detector application. The CdTe thin film was grown on glass substrate using thermal evaporation technique in vacuum to avoid the inclusion of impurities in the films. Three different samples were prepared where film thickness were 500, 600 and 700 nm measured by insitu quartz crystal thickness monitoring device during deposition process. The structural studies of the films were carried out using (X-ray diffraction) XRD analytical study and optical measurements were performed in the UV-VIS-NIR region using a spectrophotometer. The films grown at room temperature are polycrystalline as found by X-ray diffraction peaks. The optical transmission spectra of CdTe films showed a high transmission of about 85% to 90% in the visible region with a sharp fall near the fundamental absorption at 880 nm wavelength for the 500 and 600 nm films, and fundamental absorption at 1270 nm wavelength for 700 nm film.

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Section: Figure 4: Variation Of Extinction Coefficient At Different Tsupporting

confidence: 76%

Preparation of CdTe Nuclear Detector Material in Thin Film Form using Thermal Evaporation Method

Hussain¹,

Faruqe²,

Parvin³

et al. 2017

Malays. j. med. biol. res.

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“…In this pattern those peaks are thin (small) sand correspond to main phase of the C 60 fullerene molecule ordered in a face-centered cubic structure of higher symmetry which is included in the BHJ blend of Alq 3 :C 60 thin films. In this model a broad peak, in the range between 15 and 26 degrees can be observed, this peak is crowned by other well defined low intensity peaks, corresponding to lower symmetry phases C 60 ordered in orthorhombic and monoclinic structures [15].…”

Section: Resultsmentioning

confidence: 70%

Annealing effect on the structural and Morphological properties of Organic Semiconductor Alq3:C60 blend Thin Films

Noori

Abbas

Abdulameer

2018

ijs

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In this work, has been a studied the effect of thermal treatment using different annealing temperatures (373, 423 and 473) K in vacuum on structural and morphological properties of organic semiconductor Alq 3 :C 60 thin films which are prepared by the spin coating on a glass, silicon and porous silicon. These films have been coated on substrates with speed of 2000 rpm. The structure properties of Tris(8-hydroxyquinoline) aluminum (III) (Alq 3) and fullerene (C 60) (100:1) and (100:10) blend as-deposited and treated have been studied by X-ray diffraction (XRD) for glass only and morphological properties by Atomic Force Microscope (AFM) for silicon and porous silicon substrates. The results of XRD pattern shows that the structure of (Alq 3 :C 60) as-deposited and annealed thin films are polycrystalline in nature for both mixed weight ratio. The result of AFM measurements show that grain size increase is due to the increases of surface energy at high temperature. Surface roughness increasing and decreased randomly with the temperature can be attributed to the random distributions of the grains and also due to the phase change.

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Tunability of conductivity type and energy band gap of CdTe thin film in the electrodeposition technique

Oluyamo

Faremi

Olusola

et al. 2021

Materials Today: Proceedings

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Effect of Annealing and Deposition Temperature on Structural Properties of Cdte Thin Films Prepared by Thermal Evaporation Method

Cited by 4 publications

References 0 publications

Preparation of CdTe Nuclear Detector Material in Thin Film Form using Thermal Evaporation Method

Preparation of CdTe Nuclear Detector Material in Thin Film Form using Thermal Evaporation Method

Annealing effect on the structural and Morphological properties of Organic Semiconductor Alq3:C60 blend Thin Films

Tunability of conductivity type and energy band gap of CdTe thin film in the electrodeposition technique

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