2008
DOI: 10.1109/tmag.2008.2001648
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Effect of Annealing and Barrier Thickness on MgO-Based Co/Pt and Co/Pd Multilayered Perpendicular Magnetic Tunnel Junctions

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Cited by 21 publications
(6 citation statements)
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“…Abundant published works have been reported on the interface effects of the FM=AF bilayers caused by the MFA process. 4,10,[12][13][14][15][16][17][18][19][20][21] An extended interfacial region in metal=NiO systems after annealing was exhibited due to the chemical reaction and diffusion at the interface. 10) The interface features are closely related to the interface spin configuration and thus have a considerable impact on the magnetic properties of the FM=AF bilayers.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Abundant published works have been reported on the interface effects of the FM=AF bilayers caused by the MFA process. 4,10,[12][13][14][15][16][17][18][19][20][21] An extended interfacial region in metal=NiO systems after annealing was exhibited due to the chemical reaction and diffusion at the interface. 10) The interface features are closely related to the interface spin configuration and thus have a considerable impact on the magnetic properties of the FM=AF bilayers.…”
Section: Introductionmentioning
confidence: 99%
“…The microstructural and magnetic properties of the CoFe=NiO bilayers were investigated with different annealing temperatures (T MFA = 523, 573, and 623 K). The CoFe thickness (20,30, and 40 nm) was tuned to study both the microstructural interface and volume effects on the magnetism of the CoFe=NiO bilayers.…”
Section: Introductionmentioning
confidence: 99%
“…7) Among these methods, the ion-beam bombardment is an effective technique to modify the microstructural and compositional features of the FM=AF bilayers by altering crystallographic orientations, 8) changing grain sizes, 6) facilitating interlayer diffusion, 3,9) and so on. The altered microstructural and compositional properties can nontrivially influence the exchange bias and coercivity of the FM=AF bilayers, [2][3][4]8,10,11) revealing the critical role of the ion-beam bombardment in modifying the magnetism of the FM=AF bilayers.…”
Section: Introductionmentioning
confidence: 99%
“…10 One of the experimental techniques already widely adopted for making high-quality MgO-based MTJs is to deposit an ultrathin Mg layer on top of the bottom ferromagnetic electrode layer prior to the deposition of MgO [11][12][13][14][15][16][17] or to insert a Mg interlayer at each electrode/barrier interface of the junction. 18 The advantages of inserting Mg interlayers include ͑1͒ the slightly but not fully oxidized Mg layer yields a low-resistance-area product of the junction while maintaining a high TMR ratio at the same time. 11 ͑2͒ It can also serve as a crystalline seed so that the texture of the subsequently deposited MgO͑001͒ barrier as well as the junction interface can be much improved.…”
Section: Introductionmentioning
confidence: 99%