Abstract:The exchange bias effect in ferromagnetic (FM)/antiferromagnetic (AF) bilayer structures has been widely investigated because its underlying principle is critical for spintronic applications. In this work, the effect of Ar + beam bombardment on the microstructural and magnetic properties of the Mn/NiFe thin films was investigated. The in-situ Ar + bombardment nontrivially promoted the Mn/NiFe intermixing and facilitated the formation of the FeMn phase, accompanied by a remarkable reduction of Mn and NiFe layer… Show more
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