2011
DOI: 10.1016/j.surfcoat.2011.02.052
|View full text |Cite
|
Sign up to set email alerts
|

Effect of air annealing on mechanical properties and structure of amorphous B4C films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
5
0

Year Published

2013
2013
2024
2024

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 15 publications
(8 citation statements)
references
References 17 publications
0
5
0
Order By: Relevance
“…From this analysis, it is clear that deposition pressure is a key parameter allowing the microstructure and the morphology of the LMNO films to be tailored while keeping the thin film strongly adhesive on the substrate. The stress of the sputtered LMNO thin films has been reduced after the annealing process as already observed in refs and on other thin film materials (B 4 C, W), probably owing to the formation of voids within the thin films as depicted on the SEM cross sections shown in Figure or due to the crystallization process. Subsequently, an in-depth study dealing with the influence of the pressure on LMNO structural and electrochemical properties is proposed in the following paragraphs.…”
Section: Results and Discussionmentioning
confidence: 99%
“…From this analysis, it is clear that deposition pressure is a key parameter allowing the microstructure and the morphology of the LMNO films to be tailored while keeping the thin film strongly adhesive on the substrate. The stress of the sputtered LMNO thin films has been reduced after the annealing process as already observed in refs and on other thin film materials (B 4 C, W), probably owing to the formation of voids within the thin films as depicted on the SEM cross sections shown in Figure or due to the crystallization process. Subsequently, an in-depth study dealing with the influence of the pressure on LMNO structural and electrochemical properties is proposed in the following paragraphs.…”
Section: Results and Discussionmentioning
confidence: 99%
“…Wu et al 54) have prepared B x C films via DC magnetron sputtering at various pressures and showed that the stress decreased from ∼2.9 to ∼0.4 GPa with an increase in pressure. Kulikovsky et al 55) have annealed B 4 C films prepared via DC magnetron sputtering in air atmosphere, and the stress was reduced from ∼3.1 to ∼0.5 GPa with increasing annealing temperature. The internal stresses of our samples were lower than those reported by Lousa et al 4) and Ulrich et al; 10) however, their values were high and must be further reduced.…”
Section: Resultsmentioning
confidence: 99%
“…It is well known that amorphous boron carbide films deposited by magnetron sputtering have high residual compressive stresses dependent on the deposition conditions [29]. The residual stresses can be relaxed by annealing of the films [30]. In this work a Gaussian laser beam was used.…”
Section: Discussionmentioning
confidence: 99%