2010
DOI: 10.1063/1.3361036
|View full text |Cite
|
Sign up to set email alerts
|

Effect of a lattice-matched GaAsSb capping layer on the structural properties of InAs/InGaAs/InP quantum dots

Abstract: Document VersionPublisher's PDF, also known as Version of Record (includes final page, issue and volume numbers)Please check the document version of this publication:• A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
5
0

Year Published

2010
2010
2018
2018

Publication Types

Select...
7
1

Relationship

2
6

Authors

Journals

citations
Cited by 10 publications
(6 citation statements)
references
References 22 publications
1
5
0
Order By: Relevance
“…In such a way, the overall shape of the quantum dot, the atomic structure of the wetting layers and dot, and the presence and effect of doping atoms can be studied. The solid that contains the self-assembled quantum dots can be cleaved under ultrahigh-vacuum conditions, enabling cross-sectional microscopy and energy-level spectroscopy (refs , , , , , , , , and ). Recently, cross-sectional microscopy has been combined with atom probe tomography, which allows one to make detailed cross sections of the atomic structure of the quantum dot combined with tunneling spectroscopy.…”
Section: Colloidal Nanocrystals Of Semiconductor Compounds: Scientifi...mentioning
confidence: 96%
“…In such a way, the overall shape of the quantum dot, the atomic structure of the wetting layers and dot, and the presence and effect of doping atoms can be studied. The solid that contains the self-assembled quantum dots can be cleaved under ultrahigh-vacuum conditions, enabling cross-sectional microscopy and energy-level spectroscopy (refs , , , , , , , , and ). Recently, cross-sectional microscopy has been combined with atom probe tomography, which allows one to make detailed cross sections of the atomic structure of the quantum dot combined with tunneling spectroscopy.…”
Section: Colloidal Nanocrystals Of Semiconductor Compounds: Scientifi...mentioning
confidence: 96%
“…11 Several research groups have studied the use of GaAsSb strain reducing layers on top of InAs QDs. [12][13][14][15][16] Because of the strong segregation of Sb during GaAsSb growth on GaAs, the first monolayer ͑ML͒ on top of the QDs have a very low Sb content. 17 Here we report on the changes induced by solid source Sb deposition ͑without codeposition of Ga or As͒, after InAs QD formation and immediately before QD capping with…”
Section: Introductionmentioning
confidence: 99%
“…The larger QW lattice constant compared to GaAs reduces the strain induced in the QDs during the capping process, preserving the shape, and reducing the decomposition of the dots. [4][5][6] Moreover, contrary to other strain-relieving layers, GaAsSb QW with 14% Sb keeps the confining potential of both electrons and holes essentially identical to that of InAs QDs in GaAs matrix. This limits the carrier thermal escape from the QDs and consequently leads to optimized emission intensity and spectral width, 7,8 although the spatial localization of the holes is reduced.…”
Section: 3mentioning
confidence: 99%