2008
DOI: 10.1088/0029-5515/48/11/115006
|View full text |Cite
|
Sign up to set email alerts
|

Edge Te and ne profiles during type-I ELM mitigation experiments with perturbation fields on JET

Abstract: Edge localized mode (ELM) mitigation experiments have been carried out at JET in type-I ELMy H-mode plasmas. ELM mitigation was achieved through a stochastic edge induced by the ex-vessel error field correction coils system and was found to be independent of the distance of the plasma edge to the JET wall. In all cases the detrimental effect of the ELM on pedestal confinement was considerably reduced during the stochastization phase. The new high resolution Thomson scattering (HRTS) diagnostic, which has recen… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

2
14
1

Year Published

2009
2009
2014
2014

Publication Types

Select...
6
1
1

Relationship

1
7

Authors

Journals

citations
Cited by 16 publications
(17 citation statements)
references
References 39 publications
2
14
1
Order By: Relevance
“…Figure 2 shows comparison of the edge pedestal recovery after a normal type-I ELM crash and a mitigated ELM crash with n = 1 field. Here, the pedestal electron density, temperature and pressure are measured by the high resolution Thomson scatting and averaged over several ELM cycles [5]. With n = 1 field, the ELM frequency increased by a factor of ∼ 2 (from ∼ 15 Hz to ∼ 30 Hz), and the pedestal density recovered only up to ∼ 80 % of that in the case without n = 1 field.…”
Section: Dynamic Of Edge Profilesmentioning
confidence: 99%
See 1 more Smart Citation
“…Figure 2 shows comparison of the edge pedestal recovery after a normal type-I ELM crash and a mitigated ELM crash with n = 1 field. Here, the pedestal electron density, temperature and pressure are measured by the high resolution Thomson scatting and averaged over several ELM cycles [5]. With n = 1 field, the ELM frequency increased by a factor of ∼ 2 (from ∼ 15 Hz to ∼ 30 Hz), and the pedestal density recovered only up to ∼ 80 % of that in the case without n = 1 field.…”
Section: Dynamic Of Edge Profilesmentioning
confidence: 99%
“…Transport analysis using the TRANSP code shows up to 20 % reduction of the thermal energy confinement time because of density pump-out, but when normalised to the IPB98(y, 2) scaling the confinement time shows almost no reduction. Stability analysis of the controlled ELMs suggests that the operational point with n = 1 field moves from the intermediate-n peeling-ballooning boundary to the low-n peeling boundary, and the radial width of the most unstable mode reduced from ∼ 3 % down to ∼ 1 % of the normalised minor radius [5,6]. The results of ELM control with the n = 2 fields on JET demonstrate that the frequency of ELMs can be increased by a factor of 3.5 with the present capability of the EFCC power supply.…”
Section: Introductionmentioning
confidence: 99%
“…However, it has to be stated, that the scaling of the 'flushing' effect is not yet investigated. Suppression of ELMs by increasing the overall edge transport with edge resonant magnetic field perturbations as pioneered by DIII-D [65,66] and JET [67,68], may also be a solution. However, common to these experiments is the tendency that the separatrix temperature increases during the ELM suppression phases, which is consistent with an increase of Z ef f compared to similar discharges without edge perturbation as reported by [69] and which would be counter productive in the case of high-Z PFCs.…”
Section: Itermentioning
confidence: 99%
“…However, it has to be stated, that the scaling of the 'flushing' effect is not yet investigated. Suppression of ELMs by increasing the overall edge transport with edge resonant magnetic field perturbations as pioneered by DIII-D [84,85] and JET [86,87], may also be a solution. However, common to these experiments is the tendency that the separatrix temperature increases during the ELM suppression phases, which is consistent with an increase of Z e f f compared to similar discharges without edge perturbation as reported by [88] and which would be counter productive in the case of high-Z PFCs.…”
Section: Extrapolation To Future Devicesmentioning
confidence: 99%