EBIC Investigations on Active Polymer Devices

Pugatschow, A.; Heiderhoff, R.; Förster, Michael; Scherf, Ullrich; Balk, L.J.

doi:10.1109/ipfa.2007.4378088

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Determination Of Electrical Field Distributions Within a Sta2

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2007

2008

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Cited by 2 publications

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“…The maximum EBIC amplitude over the drain contact of an organic field effect transistor was determined and plotted vs. the drain-source voltage in Figure 3 confirming this relationship. The local gradient of the signal gives access to energy band diagrams under different biasing conditions (Pugatschow et al 2007b).…”

Section: Quantitative Determination Of Electric Field Strengths Withimentioning

confidence: 99%

Quantitative determination of electric field strengths within dynamically operated devices using EBIC analysis in the SEM

2008

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Although electron beam-induced current (EBIC) technique was invented in the seventies, it is still a powerful technique for failure analysis and reliability investigations of modern materials and devices. Time-resolved and stroboscopic microanalyses using sampling Fourier components decomposed by modulated charge carrier excitation are introduced. Quantitative determination of electric field strengths within dynamically operated devices in the scanning electron microscope (SEM) will be demonstrated. This technique allows investigations of diffusion and drift processes and of variations of electric field distributions inside active devices.

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Section: Quantitative Determination Of Electric Field Strengths Withimentioning

confidence: 99%

Quantitative determination of electric field strengths within dynamically operated devices using EBIC analysis in the SEM

2008

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“…Both can be taken into account within spectral analyses. Even PoolFrenkel transport mechanisms are analyzable, demonstrated on organic devices recently [14].…”

Section: Determination Of Electrical Field Distributions Within a Stamentioning

confidence: 99%

Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations

Pugatschow¹,

Heiderhoff²,

Balk³

2007

Microelectronics Reliability

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EBIC Investigations on Active Polymer Devices

Cited by 2 publications

References 7 publications

Quantitative determination of electric field strengths within dynamically operated devices using EBIC analysis in the SEM

Quantitative determination of electric field strengths within dynamically operated devices using EBIC analysis in the SEM

Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations

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