Conference Proceedings. 1997 International Conference on Indium Phosphide and Related Materials
DOI: 10.1109/iciprm.1997.600154
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Dynamics of the kink effect in InAlAs/InGaAs HEMTs

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Cited by 4 publications
(7 citation statements)
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“…In order to test our model we have used lattice-matched, MBE-grown, HEMT's fabricated at MIT as a vehicle for this study [16], [18]. We examine devices with relatively long gate lengths ( m to m).…”
Section: Resultsmentioning
confidence: 99%
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“…In order to test our model we have used lattice-matched, MBE-grown, HEMT's fabricated at MIT as a vehicle for this study [16], [18]. We examine devices with relatively long gate lengths ( m to m).…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, simulations show that the kink disappears if the impact ionization mechanism is turned off in the simulator [3], [4], [15]. Finally, we have reported sidegate measurements establishing a direct relationship between impact ionization and the kink [16], [17], as well as transient measurements showing that the time constants associated with the kink are strongly correlated with the impact ionization rate [18].…”
Section: Introductionmentioning
confidence: 80%
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“…The alpha term which models the triode region of the I DS plots is a function of a hyperbolic tangent function with the midpoint and the magnitude term having V GS dependence. The alpha function used in this work is capable of modeling the kink phenomenon at the triode region and has a limiting function to prevent a negative range value.…”
Section: Modified Modeling Equations For Gan Hemt Devicesmentioning
confidence: 99%