Dynamics of contact-mode atomic force microscopes

Rifai, O.M. El

doi:10.1109/acc.2000.879575

Cited by 15 publications

(7 citation statements)

References 5 publications

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“…Modeling and analysis of AFM dynamics presented in El-Rifai and Youcef-Toumi (2000, 2001, 2002 have led to identifying model structure and various sources of uncertainties. This valuable information will be used in the controller design to maximize possible gains in performance.…”

Section: Robust Adaptive Output Controlmentioning

confidence: 99%

“…Previously, models were developed describing the dynamics of AFM (El-Rifai & Youcef-Toumi, 2000, 2001, 2002. The main dynamics of interest are those describing the vertical motion, i.e.…”

Section: In-contact Dynamics Of Atomic Force Microscopesmentioning

confidence: 99%

“…The contributions of this paper are as follows: it reviews earlier work (El-Rifai & Youcef-Toumi, 2000, 2001, 2002 on modeling of AFM dynamics and builds on it to identify an appropriate plant structure for adaptive control. A robust adaptive control based on results in the literature (Krstic, Kanellakopoulos, & Kokotovic, 1995;Xu & Yao, 1999;Yao & Tomizuka, 1997) is designed and tailored to the AFM dynamics and practical implementation.…”

Section: Introductionmentioning

confidence: 99%

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On automating atomic force microscopes: An adaptive control approach

Rifai

2007

Control Engineering Practice

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Section: Robust Adaptive Output Controlmentioning

confidence: 99%

“…Previously, models were developed describing the dynamics of AFM (El-Rifai & Youcef-Toumi, 2000, 2001, 2002. The main dynamics of interest are those describing the vertical motion, i.e.…”

Section: In-contact Dynamics Of Atomic Force Microscopesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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On automating atomic force microscopes: An adaptive control approach

Rifai

2007

Control Engineering Practice

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“…Existing AFM models can be mainly separated into two broad classes, i.e. lumped-parameter models [5,10] and distributed-parameters models [6,8,11,12,13]. In contrast to the lumped models, the distributed parameter model systems reveal greater insight into the fundamental characteristics of the AFM cantilever dynamics.…”

Section: Introductionmentioning

confidence: 99%

Enhanced performance in contact mode atomic force microscopy

Lee

Amara

2006

2006 American Control Conference

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Atomic force microscopy (AFM) had and continues to have a substantial impact on nano-sciences and technologies. However, the low scanning speed continues to be one of the obstacles that impede the widespread adoption of AFM. This paper presents a solution to control system design issues for constant force contact AFM operation to enhance the performance of AFM systems with respect to scanning speed and image resolution. The purpose of the controller is to maintain a constant slope at the free end of the AFM cantilever through suitable displacement of the base end of the cantilever. Given that the sample surface profile is not known a priori, the difficulty in the controller design lies in attempting to track an unknown and time-varying reference signal, representing the unknown surface profile. To overcome this problem, it is proposed in this paper to use an adaptive regulator design approach. The regulator design approach is based on two steps. The first step involves using the Q-parameterization of stabilizing controllers to construct a set of parameterized stabilizing controllers for the system under consideration. The second step involves tuning the Q parameter in the expression of stabilizing controller so that the controller converges to the desired controllers needed to achieve regulation. The proposed control strategy makes it possible to use small contact forces and high scanning speeds, hence improving the performance of contact mode AFM systems.

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“…A brief explanation of the model will follow, for details see [4,1,2,3]. The system's dynamics of interest are characterized by three degrees-of-freedom: z p the extension of the piezotube, θ p the piezotube bending, about the Y-axis in Figure 1, and θ c the cantilever bending relative to the tube base.…”

Section: Afm Dynamical Modelmentioning

confidence: 99%

On dual actuation in atomic force microscopes

Rifai¹,

Rifai

2004

Proceedings of the 2004 American Control Conference

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In this paper, the problem of dual actuation in the atomic force microscope (AFM) is analyzed. The use of two actuators to balance the trade-off between bandwidth, range, and precision has been recently extended to nano-positioning systems. Despite existing demands, this concept undergoes fundamental limitations towards its extension to AFMs. This is attributed to the non-conventional requirement imposed on the control signal response, as it used to create the image of the characterized surface.

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Dynamics of contact-mode atomic force microscopes

Cited by 15 publications

References 5 publications

On automating atomic force microscopes: An adaptive control approach

On automating atomic force microscopes: An adaptive control approach

Enhanced performance in contact mode atomic force microscopy

On dual actuation in atomic force microscopes

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