2008
DOI: 10.1109/jmems.2008.2004849
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Dynamic Operational Stress Measurement of MEMS Using Time-Resolved Raman Spectroscopy

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Cited by 17 publications
(13 citation statements)
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“…Room temperature resonant mechanical vibrations with ≈10 nm RMS amplitude induce unexpectedly large time-averaged tensile strains up to ≈ 4 × 10 −4 . Realistic improvements of our setup, including phase-resolved Raman measurements 35 , 36 could permit to probe dynamical strain in finer detail, including in the linear regime, where the effective coupling strength 28 could be extracted. For this purpose, larger resonant displacements may be achieved at cryogenic temperatures.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Room temperature resonant mechanical vibrations with ≈10 nm RMS amplitude induce unexpectedly large time-averaged tensile strains up to ≈ 4 × 10 −4 . Realistic improvements of our setup, including phase-resolved Raman measurements 35 , 36 could permit to probe dynamical strain in finer detail, including in the linear regime, where the effective coupling strength 28 could be extracted. For this purpose, larger resonant displacements may be achieved at cryogenic temperatures.…”
Section: Discussionmentioning
confidence: 99%
“…Recently, the interplay between electrostatically-induced strain and doping has been probed in the static regime in suspended graphene monolayers 34 . Dynamically-induced strain has been investigated using Raman spectroscopy in bulkier micro electro-mechanical systems 35 , 36 , including mesoscopic graphite cantilevers 37 but remains unexplored in resonators made from 2D materials.…”
Section: Introductionmentioning
confidence: 99%
“…For instance, a readout of the mechanical resonance of few-layer graphene cantilevers through the frequency of the Raman features has recently been demonstrated 13 . A stimulating challenge is now to implement a real-time readout 55,56 of the mechanical resonances of nanosystems based on Raman scattering spectroscopy.…”
Section: Discussionmentioning
confidence: 99%
“…Pomeroy et al [15] developed a dynamic-stress analysis method, based on time resolved micro-Raman spectroscopy, for reliability studies of microelectromechanical systems. Also, Jadaan et al [16] designed a probabilistic Weibull methodology to understand the behavior and mechanical properties of MEMS brittle materials.…”
Section: Previous Efforts On Mems Reliabilitymentioning
confidence: 99%