2012
DOI: 10.1364/oe.20.005629
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Dynamic and high-resolution live cell imaging by direct electron beam excitation

Abstract: We propose a direct electron-beam excitation assisted optical microscope with a resolution of a few tens of nanometers and it can be applied for observation of dynamic movements of nanoparticles in liquid. The technique is also useful for live cell imaging under physiological conditions as well as observation of colloidal solution, microcrystal growth in solutions, etc. In the microscope, fluorescent materials are directly excited with a focused electron beam. The direct excitation with an electron beam yields… Show more

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Cited by 42 publications
(36 citation statements)
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“…However, to achieve the maximal resolution of~10 nm, a considerable electron dose and heavy metal staining was needed on account of the usage of the backscatter detector in SEM, and the depth range was also limited. The electron beam can also be used to generate small light spots illuminating cells (Nawa et al, 2012).…”
Section: Electron Microscopy In Liquidmentioning
confidence: 99%
“…However, to achieve the maximal resolution of~10 nm, a considerable electron dose and heavy metal staining was needed on account of the usage of the backscatter detector in SEM, and the depth range was also limited. The electron beam can also be used to generate small light spots illuminating cells (Nawa et al, 2012).…”
Section: Electron Microscopy In Liquidmentioning
confidence: 99%
“…[40] The spot size used in the D-EXA microscope was calculated to a few tens of nanometers after penetrating the SiN membrane with a thickness of 50 nm at an acceleration voltage of 5 kV, [15] which is larger than that in STEM. [13] In the case of a spot size with a diameter of 30 nm in the D-EXA microscope, the electron beam was continuously irradiated in the same area with a density of about 80 electrons nm À2 (dwell time: 19 ms, probe current: 478 pA), which is two orders of magnitude below the amount used in STEM with a spot size of less than 1 nm in diameter.…”
Section: à2mentioning
confidence: 99%
“…We previously developed electron beam excitation-assisted (EXA) optical (Inami et al 2010) and direct electron beam excitation-assisted (D-EXA) optical (Nawa et al 2012) microscopies. These techniques use a point light source as a probe to obtain resolutions above the diffraction limit.…”
Section: Introductionmentioning
confidence: 99%