Dynamic alignment of a Michelson interferometer using a position-sensitive device

Prévost, Carole Gabrielle; Genest, Jérôme

doi:10.1117/12.562611

Cited by 4 publications

(5 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Interferometry applications that use a plane flat mirror with translation stage, and discrete photodetectors [ 12 – 15 ] or position sensitive device [ 16 ] will suffer erroneous measurements if the wave front angle is not limited to give acceptable modulation amplitude. This can be done by choosing an appropriate photodetector aperture width that is an order of magnitude less than the fringe line spacing.…”

Section: Discussionmentioning

confidence: 99%

“…, tilted, fringe lines of equal inclination, width and spacing are produced that contract as the tilt angle is increased and expand as the tilt angle is reduced, having a significant effect on the radiant flux over the active area. This change in radiant flux can be a source of measurement error [ 3 – 9 ] when unconsidered in applications [ 12 – 16 ].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Theoretical Analysis of Interferometer Wave Front Tilt and Fringe Radiant Flux on a Rectangular Photodetector

Smith

Fuss

2013

Sensors

View full text Add to dashboard Cite

This paper is a theoretical analysis of mirror tilt in a Michelson interferometer and its effect on the radiant flux over the active area of a rectangular photodetector or image sensor pixel. It is relevant to sensor applications using homodyne interferometry where these opto-electronic devices are employed for partial fringe counting. Formulas are derived for radiant flux across the detector for variable location within the fringe pattern and with varying wave front angle. The results indicate that the flux is a damped sine function of the wave front angle, with a decay constant of the ratio of wavelength to detector width. The modulation amplitude of the dynamic fringe pattern reduces to zero at wave front angles that are an integer multiple of this ratio and the results show that the polarity of the radiant flux changes exclusively at these multiples. Varying tilt angle causes radiant flux oscillations under an envelope curve, the frequency of which is dependent on the location of the detector with the fringe pattern. It is also shown that a fringe count of zero can be obtained for specific photodetector locations and wave front angles where the combined effect of fringe contraction and fringe tilt can have equal and opposite effects. Fringe tilt as a result of a wave front angle of 0.05° can introduce a phase measurement difference of 16° between a photodetector/pixel located 20 mm and one located 100 mm from the optical origin.

show abstract

Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Theoretical Analysis of Interferometer Wave Front Tilt and Fringe Radiant Flux on a Rectangular Photodetector

Smith

Fuss

2013

Sensors

View full text Add to dashboard Cite

show abstract

“…The optical components can then be either manually fine-adjusted via heuristic approaches, 1, 2 look-up tables, 3 or by employing automatic (also: active) alignment approaches that utilize computer-aided feedback. [4][5][6][7][8][9] Typically, a wavefront sensor is employed to monitor misalignments, assess the optical quality of the system, [10][11][12] and to provide feedback for an automated alignment. However, in general, correcting optical components is a tedious and time-consuming task.…”

Section: Introductionmentioning

confidence: 99%

Predictive tolerance bands for the correction-less assembly of optical systems

Schindlbeck

Pape

Reithmeier

2019

Optical Modeling and System Alignment

View full text Add to dashboard Cite

When assembling optical systems, uncertainties of the positioning system and overall mounting tolerances lead to the deterioration of performance due to resulting misaligned optical components. In this paper, we present a novel methodology for the correction-less assembly of optical systems based on predictive tolerance bands. By running a simulation model in parallel to the assembly process, performance predictions can be made during the assembly that take into account the uncertainties of the positioning system. Typically, optical performance can be assessed by a variety of criteria. In this paper, we utilize the Maréchal criterion based on the root mean square (RMS) error as it allows to verify if the optical system is defraction-limited. The extension with Monte Carlo methods enables the prediction of mean values and standard deviations for the chosen metric. This is done for the entire optical system yet to be assembled by integrating uncertainties of the positioning system within the simulation framework. Before assembly, a desired threshold (here the RMS value derived from the Maréchal criterion) can be specified which is predicted and monitored throughout the assembly process. For verification, we analyze a two-lens system in simulation to demonstrate our proposed framework.

show abstract

“…The alignment of optical components is crucial for the assembly of optical systems in order to ensure certain performance criteria. Examples for such optical systems range from lithographic equipment [1] to interferometers [2,3], and fourier-transform infrared spectrometers [4]. Small alignment deviations can lead to wavefront errors that can significantly impact the performance of such devices or even render them entirely useless.…”

Section: Introductionmentioning

confidence: 99%

Predictor-corrector framework for the sequential assembly of optical systems based on wavefront sensing

Schindlbeck¹,

Pape²,

Reithmeier³

2018

Opt. Express

View full text Add to dashboard Cite

Alignment of optical components is crucial for the assembly of optical systems to ensure their full functionality. In this paper we present a novel predictor-corrector framework for the sequential assembly of serial optical systems. Therein, we use a hybrid optical simulation model that comprises virtual and identified component positions. The hybrid model is constantly adapted throughout the assembly process with the help of nonlinear identification techniques and wavefront measurements. This enables prediction of the future wavefront at the detector plane and therefore allows for taking corrective measures accordingly during the assembly process if a user-defined tolerance on the wavefront error is violated. We present a novel notation for the so-called hybrid model and outline the work flow of the presented predictor-corrector framework. A beam expander is assembled as demonstrator for experimental verification of the framework. The optical setup consists of a laser, two bi-convex spherical lenses each mounted to a five degree-of-freedom stage to misalign and correct components, and a Shack-Hartmann sensor for wavefront measurements.

show abstract

Dynamic alignment of a Michelson interferometer using a position-sensitive device

Cited by 4 publications

References 0 publications

Theoretical Analysis of Interferometer Wave Front Tilt and Fringe Radiant Flux on a Rectangular Photodetector

Theoretical Analysis of Interferometer Wave Front Tilt and Fringe Radiant Flux on a Rectangular Photodetector

Predictive tolerance bands for the correction-less assembly of optical systems

Predictor-corrector framework for the sequential assembly of optical systems based on wavefront sensing

Contact Info

Product

Resources

About