2018
DOI: 10.1109/tns.2017.2783239
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Dual-Interlocked Logic for Single-Event Transient Mitigation

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Cited by 14 publications
(6 citation statements)
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“…The results show a considerable increase in the charge needed to upset the node [8]. In another work, the dual-interlocked logic family demonstrates to be more robust to single event transient (SET) propagation even for dual-node strikes with a beneficial tradeoff in area and power [9].…”
Section: Circuit Design For Improve the Reliabilitymentioning
confidence: 97%
“…The results show a considerable increase in the charge needed to upset the node [8]. In another work, the dual-interlocked logic family demonstrates to be more robust to single event transient (SET) propagation even for dual-node strikes with a beneficial tradeoff in area and power [9].…”
Section: Circuit Design For Improve the Reliabilitymentioning
confidence: 97%
“…The foundry worst case libraries are a good stand-in for modelling radiation damage. All weights are stored in registers and no SRAMs or DICE cells [27] are used. Fig.…”
Section: Integrated Converter Encoder and Imentioning
confidence: 99%
“…The foundry worst case libraries are a good stand-in for modelling radiation damage. All weights are stored in registers and no SRAMs or DICE cells [27] are used. Single Event Effect Mitigation: Mitigating single-event effects (SEEs) is a critical step in the ASIC implementation for effective performance in the HL-LHC environment.…”
Section: Architectural Explorationmentioning
confidence: 99%