2009
DOI: 10.1149/1.3152980
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Down-scaling of Thin-Film Transistors: Opportunities and Design Challenges

Abstract: With the ever-increasing demands for integration of advanced electronic functions into large-area electronics, down-scaling of thin-film transistors (TFTs) becomes very necessary. The key device operational issues associated with TFT scaling, including short-channel effects (SCEs) and self-heating, are considered in this paper. Device structure engineering approaches are introduced to suppress the SCEs for designing short-channel TFTs with excellent digital and analog performance. And electro-thermal simulatio… Show more

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Cited by 13 publications
(7 citation statements)
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References 20 publications
(28 reference statements)
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“…Current mirrors (CMs) are essential circuit blocks for analog circuit biasing and active loads in a multitude of signal processing, amplification and conversion applications. Device non-idealities usually limit current copying performance [51] with the numerous improvements proposed thus far generally coming at the expense of operating voltage, speed or complexity [52]. As previously noted, in emerging printed and flexible LAE circuits, minimizing components reduces area, thereby increasing reliability and ultimately yield [7].…”
Section: Current Mirrors With Geometrically Tuneable Temperature mentioning
confidence: 99%
“…Current mirrors (CMs) are essential circuit blocks for analog circuit biasing and active loads in a multitude of signal processing, amplification and conversion applications. Device non-idealities usually limit current copying performance [51] with the numerous improvements proposed thus far generally coming at the expense of operating voltage, speed or complexity [52]. As previously noted, in emerging printed and flexible LAE circuits, minimizing components reduces area, thereby increasing reliability and ultimately yield [7].…”
Section: Current Mirrors With Geometrically Tuneable Temperature mentioning
confidence: 99%
“…Gate dielectric determines the areal dielectric capacitance (C i = kε 0 /t i ) and accordingly the areal charge density in the channel (Q i ), where k is the dielectric constant relative to that of vacuum (ε 0 ) and t i is the dielectric thickness. A large C i is desired for reducing the operating voltage, enhancing the transconductance and minimizing the shortchannel effects with scaled devices [63]. It can be obtained by either decreasing t i or is increasing k. For the former, however, the gate leakage should not be increased and for the later the device performance cannot be sacrificed.…”
Section: Review Of Current Statusmentioning
confidence: 99%
“…The configuration of an OFET is more similar to that of a silicon‐on‐insulator (SOI) MOSFET, for which the analysis at the base of the definition of critical length cannot be applied . To the best of our knowledge, there is no analytical model to determine an analogous of the critical length λ for these devices, and researchers have relied on simulations and on empirical relations.…”
Section: Open Challenges In the Route To Ghz Organic Fetsmentioning
confidence: 99%
“…In conventional silicon electronics, the main path for heat dissipation flows through the silicon substrate, which has a thermal conductivity ≈150 W m ‐1 K ‐1 . The use of plastic substrates, or even glass, exhibiting thermal conductivities in the range 0.1–1 W m ‐1 K ‐1 , severely complicates the dissipation of the excess heat …”
Section: Open Challenges In the Route To Ghz Organic Fetsmentioning
confidence: 99%
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