2006
DOI: 10.1149/1.2355745
|View full text |Cite
|
Sign up to set email alerts
|

Doping of Silicon Crystals with Bi and other Volatile Elements by the Pedestal Growth Technique

Abstract: Monocrystalline, high purity FZ-Silicon doped with bismuth is a promising laser material for the not jet opened up THz-band. With pilldoping during the common FZ-process only a narrow axial part of the crystal could be doped at a sufficient level. Crystals with FZ-like purity and a longer, highly doped section were grown after the well known pedestal technique using a specially developed pill-doping method out from axial holes in the pedestal feed rod being caped by the molten zone. Also doping with lithium an… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
17
0
3

Year Published

2013
2013
2024
2024

Publication Types

Select...
9

Relationship

1
8

Authors

Journals

citations
Cited by 26 publications
(20 citation statements)
references
References 1 publication
0
17
0
3
Order By: Relevance
“…In the silicon samples we study here, Bi donors were introduced during crystal growth using the method developed in Ref [25], with concentrations ranging from 3.6 × 10 14 cm −3 to 4.4 × 10 15 cm −3 . Pulsed-ESR experiments were performed using a spectrometer based around a modified Bruker Elexsys E580 system with a ∼7 GHz loop-gap cavity (for the CT) and 9.75 GHz dielectric resonator.…”
mentioning
confidence: 99%
“…In the silicon samples we study here, Bi donors were introduced during crystal growth using the method developed in Ref [25], with concentrations ranging from 3.6 × 10 14 cm −3 to 4.4 × 10 15 cm −3 . Pulsed-ESR experiments were performed using a spectrometer based around a modified Bruker Elexsys E580 system with a ∼7 GHz loop-gap cavity (for the CT) and 9.75 GHz dielectric resonator.…”
mentioning
confidence: 99%
“…Легирование исходного кремния, получаемого бестигельной зонной плавкой, проводилось методом выращивания с пьедестала [9]. Концентрация висмута в кристалле составляла N D ≈ 3 • 10 15 см −3 .…”
Section: экспериментunclassified
“…Легирование исходного БЗП кремния проводилось методом выращивания с пьедестала [6]. Концентрация висмута в кристалле составляла ∼ N D ∼ 3 • 10 15 см.…”
Section: экспериментunclassified