2000
DOI: 10.1016/s0040-6090(99)00888-3
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Doping effects on the optical properties of evaporated a-Si:H films

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Cited by 28 publications
(14 citation statements)
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“…The absolute values of the measured transmittance T and reflectance R at different wavelength, after correction of the absorbance and reflectance of the substrate, are given by [17,18]:…”
Section: Methods Of Calculationmentioning
confidence: 99%
“…The absolute values of the measured transmittance T and reflectance R at different wavelength, after correction of the absorbance and reflectance of the substrate, are given by [17,18]:…”
Section: Methods Of Calculationmentioning
confidence: 99%
“…After correction of the absorbance and reflectance of the substrate are given by [8,9] T~( ! :Jt-R,)…”
Section: ! Experimental Detailsmentioning
confidence: 99%
“…a computer program comprising a modified search technique, [8] based on minimizing (ARY and (AT)2, simultaneously, where where, T eltP and Rexp are the experimentally detennined values ofT and R respectively, and R(n.k) and 'f<n.k) are the calculated values of T and R, using the Munnann's exact equations [8,9]. (R+n<1 at shorter wavelengths (A < 900 nm) due to existance of absorption (absorbing region).…”
Section: ! Experimental Detailsmentioning
confidence: 99%
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“…The absolute values of T and R at different wavelengths (making base line correction with the substrates) are given by the following equation [20,21]:…”
Section: Film Deposition and Measurementsmentioning
confidence: 99%