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2014
DOI: 10.1109/jphotov.2013.2294757
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Doped Layer Optimization for Silicon Heterojunctions by Injection-Level-Dependent Open-Circuit Voltage Measurements

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Cited by 65 publications
(53 citation statements)
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“…This evidence supports the belief that the WF of the n-type TCO, being lower than the one of a-Si:H(p), may result rather in a Schottky than an ohmic contact, causing a V oc drop and resistive losses under solar cell operation conditions [39], [42]. The value of n at 100 suns (n 100 ) was proposed as indicator for the strength of this effect [4].…”
Section: B Effects On Operating Voltage 1) High-low Suns-v Oc Curvessupporting
confidence: 77%
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“…This evidence supports the belief that the WF of the n-type TCO, being lower than the one of a-Si:H(p), may result rather in a Schottky than an ohmic contact, causing a V oc drop and resistive losses under solar cell operation conditions [39], [42]. The value of n at 100 suns (n 100 ) was proposed as indicator for the strength of this effect [4].…”
Section: B Effects On Operating Voltage 1) High-low Suns-v Oc Curvessupporting
confidence: 77%
“…Earlier, the high-illumination suns-V oc data were argued to be a useful diagnostic tool to characterize back-contacts in diffused homojunction c-Si devices [41]. Later on, as already mentioned in Section I, the same approach was also applied for the characterization of the a-Si:H(p)/TCO interface in SHJ devices [3], [4]. For such samples, a lowering of the measured V oc at high illumination intensities was sometimes observed.…”
Section: B Effects On Operating Voltage 1) High-low Suns-v Oc Curvesmentioning
confidence: 99%
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