Domain wall trajectory determined by its fractional topological edge defects

Pushp, Aakash; Phung, Timothy; Rettner, Charles; Hughes, Brian; Yang, See‐Hun; Thomas, Luc; Parkin, Stuart S. P.

doi:10.1038/nphys2669

Cited by 116 publications

(114 citation statements)

References 27 publications

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“…A good control of the essential parameters needed for nucleation of these topological defects would open the route to understand defect interactions on an individual basis (in contrast with previous statistical studies in disordered patterns 6,9,[12][13][14][15] ) and, also, to study the physics of nucleation and propagation of the observed fractional topological defects (coupled 1 2 disclination -1 2 vortex) which is interesting for magnetic logic devices. 20,35 However, in Ref. 26, the controlled nucleation of topological defects was only observed under specific geometrical parameters and magnetic history conditions.…”

Section: Introductionmentioning

confidence: 99%

Controlled nucleation of topological defects in the stripe domain patterns of lateral multilayers with perpendicular magnetic anisotropy

et al. 2013

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Magnetic lateral multilayers have been fabricated on weak perpendicular magnetic anisotropy amorphous Nd-Co films in order to perform a systematic study on the conditions for controlled nucleation of topological defects within their magnetic stripe domain pattern. A lateral thickness modulation of period w is defined on the nanostructured samples that, in turn, induces a lateral modulation of both magnetic stripe domain periods λ and average in-plane magnetization component M in-plane . Depending on lateral multilayer period and in-plane applied field, thin and thick regions switch independently during in-plane magnetization reversal and domain walls are created within the in-plane magnetization configuration coupled to variable angle grain boundaries and disclinations within the magnetic stripe domain patterns. This process is mainly driven by the competition between rotatable anisotropy (that couples the magnetic stripe pattern to in-plane magnetization) and in-plane shape anisotropy induced by the periodic thickness modulation. However, as the structural period w becomes comparable to magnetic stripe period λ, the nucleation of topological defects at the interfaces between thin and thick regions is hindered by a size effect and stripe domains in the different thickness regions become strongly coupled.

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Section: Introductionmentioning

confidence: 99%

Controlled nucleation of topological defects in the stripe domain patterns of lateral multilayers with perpendicular magnetic anisotropy

et al. 2013

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“…For example, in artificial spin ice systems, the path of a vortex domain wall through the Y-shaped junctions depends on its sense of chirality. 11,12 Here, we demonstrate the controlled generation of domain walls with defined chirality on a nanosecond timescale in permalloy ðNi 80 Fe 20 Þ nanowires with a tilted stripline. The samples are prepared by two electron-beam lithography steps with positive PMMA resists and lift-off technique.…”

mentioning

confidence: 99%

Fast generation of domain walls with defined chirality in nanowires

Sentker

Stein

Bocklage

et al. 2014

Applied Physics Letters

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“…In contrast to the already studied open-loop DW based device structure 16,17 , this alternative concept includes a different geometrical feature, namely a cross-shaped intersection of nanowires, which has been investigated numerically and experimentally 15,[18][19][20][21] . This geometry ultimately enables a disruptive device that can count millions of turns.…”

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confidence: 99%

Geometrically enhanced closed-loop multi-turn sensor devices that enable reliable magnetic domain wall motion

Borie

Wahrhusen²,

Grimm³

et al. 2017

Applied Physics Letters

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We experimentally realize a sophisticated structure geometry for reliable magnetic domain wall-based multiturn-counting sensor devices, which we term closed-loop devices that can sense millions of turns. The concept relies on the reliable propagation of domain walls through a cross-shaped intersection of magnetic conduits, to allow the intertwining of loops of the sensor device. As a key step to reach the necessary reliability of the operation, we develop a combination of tilted wires called the syphon structure at the entrances of the cross. We measure the control and reliability of the domain wall propagation individually for cross-shaped intersections, the syphon geometries and finally combinations of the two for various field configurations (strengths and angles). The various measured syphon geometries yield a dependence of the domain wall propagation on the shape that we explain by the effectively acting transverse and longitudinal external applied magnetic fields. The combination of both elements yields a behaviour that cannot be explained by a simple superposition of the individual different maximum field operation values. We identify as an additional process the nucleation of domain walls in the cross, which then allows us to fully gauge the operational parameters. Finally, we demonstrate that by tuning the central dimensions of the cross and choosing the optimum angle for the syphon structure reliable sensor operation is achieved, which paves the way for disruptive multi-turn sensor devices.

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Domain wall trajectory determined by its fractional topological edge defects

Cited by 116 publications

References 27 publications

Controlled nucleation of topological defects in the stripe domain patterns of lateral multilayers with perpendicular magnetic anisotropy

Controlled nucleation of topological defects in the stripe domain patterns of lateral multilayers with perpendicular magnetic anisotropy

Fast generation of domain walls with defined chirality in nanowires

Geometrically enhanced closed-loop multi-turn sensor devices that enable reliable magnetic domain wall motion

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