2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 2015
DOI: 10.1109/icse.2015.102
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Does the Failing Test Execute a Single or Multiple Faults? An Approach to Classifying Failing Tests

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Cited by 19 publications
(13 citation statements)
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“…Hajri et al [82] used a logistical progression model to automatically classify the test cases for use case-driven testing in product lines. Yu et al [318] proposed a technique that can be used to distinguish failing tests that executed a single fault from those that executed multiple faults. The technique combines information from a set of fault localization ranked lists, each produced for a certain failing test, and the distance between a failing test and the passing test that most resembles it.…”
Section: Test Casementioning
confidence: 99%
“…Hajri et al [82] used a logistical progression model to automatically classify the test cases for use case-driven testing in product lines. Yu et al [318] proposed a technique that can be used to distinguish failing tests that executed a single fault from those that executed multiple faults. The technique combines information from a set of fault localization ranked lists, each produced for a certain failing test, and the distance between a failing test and the passing test that most resembles it.…”
Section: Test Casementioning
confidence: 99%
“…However, only further studies with more diverse programs and faults can strengthen claims for generalisation. Additionally, the reported results are strictly based on the failure-to-single-fault assumption [11], and may not generalise for multiple-fault failures [60]. We will consider overlapping clustering [51,52,56,58] to handle such cases in the future.…”
Section: Threats To Validitymentioning
confidence: 99%
“…Therefore, the findings show that Expense score and Exam score are the most utilized by the selected papers, respectively. [17,27,29,33,[52][53][54][55][56][57] Exam score [43, 49-51, 63, 64, 67] Wasted effort [46][47][48]65] Precision & recall [44,45,66] e) Fault Isolation Fault isolation is the process of isolating faults caused by different failures into separate clusters for efficient and more effective multiple fault localization. Most of the selected papers that utilized method such as parallel debugging used various clustering algorithms to isolate faults.…”
Section: D) the Evaluation Metrics Utilized Across The Selected Studiesmentioning
confidence: 99%