Dispersion of Plasma Oscillations in Amorphous Chalcogenide Semiconductors

Стожаров, В. М.

doi:10.1134/s1063784221060189

Cited by 2 publications

(1 citation statement)

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“…In our works [34,42], the dispersion of plasmons is represented by the dependence of their energy, measured at different azimuthal angles β, on the wave vector. In [39], where the dispersion of surface plasmons in structures with a conductive film was studied, the plasma wavenumber was introduced:…”

Section: Dispersion Of Surface Plasmons In Solidsmentioning

confidence: 99%

Surface Plasmons Excited by X-rays in the Surface Layers of Solids

Стожаров¹

2022

Solids

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The phenomenon of total external reflection of X-rays at a sliding angle of incidence of a beam of incident X-rays is investigated. For metals, a quantitative law of direct dependence of the refractive index decrement on the interplane distance is obtained. The excitation of surface plasmons by X-rays that have experienced complete external reflection is detected. For surface plasmons, a dimensional effect was observed, expressed in an increase in the energy of plasmons and the concentration of conduction electrons with an increase in the depth of the output of surface plasmons. By the method of dispersion of surface plasmons, internal mechanical micro-stresses and spontaneous polarization of the surface layers of glassy dielectrics and in thin layers of vanadium dioxide were determined. The absence of micro-stresses in the lithium fluoride ionic single crystal was found out, and the polarization observed in it is due to the large dipole moment of the molecules of this crystal. In thin films of vanadium dioxide, the dependence of micro-stresses on the stresses in the substrates was found.

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Section: Dispersion Of Surface Plasmons In Solidsmentioning

confidence: 99%