2016
DOI: 10.1038/srep22709
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Dislocation-free Ge Nano-crystals via Pattern Independent Selective Ge Heteroepitaxy on Si Nano-Tip Wafers

Abstract: The integration of dislocation-free Ge nano-islands was realized via selective molecular beam epitaxy on Si nano-tip patterned substrates. The Si-tip wafers feature a rectangular array of nanometer sized Si tips with (001) facet exposed among a SiO2 matrix. These wafers were fabricated by complementary metal-oxide-semiconductor (CMOS) compatible nanotechnology. Calculations based on nucleation theory predict that the selective growth occurs close to thermodynamic equilibrium, where condensation of Ge adatoms o… Show more

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Cited by 28 publications
(37 citation statements)
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“…Moreover, the reflectance of the conformal graphene/SiNHs heterostructure was found to be further reduced below 10% due to the additional absorption through graphene. Another important class of textured-Si substrate is Si-nanotip arrays, [80][81][82] which was also used for fabricating CVD-graphene/nanotip-textured Si based heterostructures for PD application. [83] Figure 6a shows the fabrication process of the n-type Si-nanotip arrays based textured-Si substrate.…”
Section: Fabrication Of Cvd-graphene/textured-si Heterostructures For Photodetectorsmentioning
confidence: 99%
“…Moreover, the reflectance of the conformal graphene/SiNHs heterostructure was found to be further reduced below 10% due to the additional absorption through graphene. Another important class of textured-Si substrate is Si-nanotip arrays, [80][81][82] which was also used for fabricating CVD-graphene/nanotip-textured Si based heterostructures for PD application. [83] Figure 6a shows the fabrication process of the n-type Si-nanotip arrays based textured-Si substrate.…”
Section: Fabrication Of Cvd-graphene/textured-si Heterostructures For Photodetectorsmentioning
confidence: 99%
“…Further fabrication details can be found in refs. [43][44][45] In the following, we name as "sample A" the InP-NCs/Si-tips and as "sample B" the Gr/InP-NCs/Si-tips. Scanning electron microscopy (SEM) tilted- Electrical measurements were performed inside a Zeiss LEO 1430 SEM chamber in high vacuum (< 10 -6 Torr) and at room temperature.…”
mentioning
confidence: 99%
“…The inset shows gold at the top of the germanium nanowire, where continuous homoepitaxial growth was catalysed. A sample with a silicon nanotip [ 22 ] surrounded by a silicon oxide matrix is shown in Fig. 4 and Fig.…”
Section: Resultsmentioning
confidence: 99%