The nanoscale determination of the
mechanical properties of interfaces
is of paramount relevance in materials science and cell biology. Bimodal
atomic force microscopy (AFM) is arguably the most advanced nanoscale
method for mapping the elastic modulus of interfaces. Simulations,
theory, and experiments have validated bimodal AFM measurements on
thick samples (from micrometer to millimeter). However, the bottom-effect
artifact, this is, the influence of the rigid support on the determination
of the Young’s modulus, questions its accuracy for ultrathin
materials and interfaces (1–15 nm). Here we develop a bottom-effect
correction method that yields the intrinsic Young’s modulus
value of a material independent of its thickness. Experiments and
numerical simulations validate the accuracy of the method for a wide
range of materials (1 MPa to 100 GPa). Otherwise, the Young’s
modulus of an ultrathin material might be overestimated by a 10-fold
factor.