Direct Imaging of Nanoscale Phase Separation in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi>La</mml:mi><mml:mn>0.55</mml:mn></mml:msub><mml:msub><mml:mi>Ca</mml:mi><mml:mn>0.45</mml:mn></mml:msub><mml:msub><mml:mi>MnO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math>: Relationship to Colossal Magnetoresistance

Tao, Jing; Niebieskikwiat, D.; Varela, M.; Luo, Weidong; Schofield, M. A.; Zhu, Yinyan; Salamon, M. B.; Zuo, Jian‐Min; Pantelides, S. T.; Pennycook, S. J.

doi:10.1103/physrevlett.103.097202

Cited by 128 publications

(101 citation statements)

References 31 publications

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“…To compensate for this, a single multiplicative factor of 0.86 was applied to all SrTiO 3 datasets prior to quantitative image comparison with the simulations. This factor is consistent with the difference between the total integrated intensity of the whole PACBED pattern of each dataset (scattering angle up to 4α for SrTiO 3 ) and the total intensity from the aperture image in vacuum, to within the uncertainty introduced by the relatively large variations of the dark current reference and weak SNR at high scattering angles in the CBED patterns. (Note that simulations show the percentage of electron intensity scattered outside the scattering angle of 4α is less than 1% for even the thicker specimen region considered.…”

Section: Experimental Methods and Data Processingsupporting

confidence: 83%

“…Two materials were chosen in this study, monolayer MoS 2 and bulk SrTiO 3 . Monolayer MoS 2 is a weakly scattering material, making it suitable for differential phase contrast imaging since the phase-object approximation is expected to be satisfied.…”

Section: Experimental Methods and Data Processingmentioning

confidence: 99%

“…The Gaussian width was determined by comparing the averaged experimental HAADF images acquired simultaneously with the 4D dataset acquisition with HAADF images simulated using the quantum excitation of phonons method implemented in the software μSTEM [13,14]. The half-width half-maximum (HWHM) thus determined is approximately 0.45 Å for MoS 2 and 0.50 Å for SrTiO 3 . The incident beam intensity for image normalization was measured by taking one aperture image in vacuum for each experimental condition using the same camera.…”

Section: Experimental Methods and Data Processingmentioning

confidence: 99%

“…We used = μ C 1 m s to model a small residual C s . As coherent bright field images are sensitive to defocus, the contrastdefined as the ratio between standard deviation and mean intensity -of the cBF4 image for MoS 2 and the cBF10 image for SrTiO 3 was used to estimate defocus, giving − Å 50 for MoS 2 , − Å 30 for the 35 Å thick region of SrTiO 3 , and − Å 20 for the 78 Å region SrTiO 3 . In conventional high-resolution TEM imaging, two-dimensional image fitting is often used to determine/refine the imaging conditions (e.g.…”

Section: Quantitative Imaging From 4d Datasetsmentioning

confidence: 99%

“…However, traditional STEM experiments such as bright field (BF) or annular dark field (ADF) use monolithic detectors that integrate over many points in the diffraction plane to allow fast acquisition and high signal-to-noise ratio (SNR). Though position-resolved electron diffraction has a long history [1][2][3], the slow readout speed of the conventional CCD camera, limited data transfer speed and limited storage space have restricted acquisition to a small number of frames, making atomic resolution diffractive imaging extremely challenging [4]. Recent developments in fast-readout pixel detectors and powerful computers significantly improve the speed of data acquisition and transfer, and make possible the acquisition of two-dimensional CBED patterns with two dimensional probe scanning positions -a four dimensional (4D) dataset -at atomic resolution [5][6][7].…”

Section: Introductionmentioning

confidence: 99%

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Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

et al. 2016

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a b s t r a c tFour-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full twodimensional convergent beam electron diffraction (CBED) pattern is acquired at every STEM pixel scanned. Capturing the full diffraction pattern provides a rich dataset that potentially contains more information about the specimen than is contained in conventional imaging modes using conventional integrating detectors. Using 4D datasets in STEM from two specimens, monolayer MoS 2 and bulk SrTiO 3 , we demonstrate multiple STEM imaging modes on a quantitative absolute intensity scale, including phase reconstruction of the transmission function via differential phase contrast imaging. Practical issues about sampling (i.e. number of detector pixels), signal-to-noise enhancement and data reduction of large 4D-STEM datasets are emphasized.

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Section: Experimental Methods and Data Processingsupporting

confidence: 83%

Section: Experimental Methods and Data Processingmentioning

confidence: 99%

Section: Experimental Methods and Data Processingmentioning

confidence: 99%

Section: Quantitative Imaging From 4d Datasetsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

et al. 2016

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Three‐dimensional nanostructure determination from large diffraction dataset

Meng

Zuo

2016

European Microscopy Congress 2016: Proceedings

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Electron tomography relies on mass‐thickness contrast. However, chemically homogeneous nanostructures can not be studied using this technique. Nanocrystalline materials in general are structurally featured by a large density of grain boundaries and large surface/volume ratio, which have attracted significant interest for their unique mechanical, chemical and electronic properties. 1‐3 Transmission electron diffraction (TED) is an appropriate technique for complex nanostructure analysis because it is highly sensitive to local structure and it can be obtained using a small electron beam. Previously we have developed a TEM based scanning electron nanodiffraction (SEND) technique that uses the built‐in TEM deflection coils to shift the beam. 4 Here, we report a new technique called 3D‐SEND by coupling the SEND with diffraction tomography. This technique aims at determining the 3D morphologies and orientations of grains in nanocrystalline materials. A special holder design is employed for a high‐angle (up to 87°) sample rotation. 5 The design employs a needle‐shape specimen and a sample rotation driven by the goniometer itself. Diffraction pattern recording and beam scanning are automated using a DigitalMicrograph ® script to control the TEM deflection coils and camera readout. 6 A stack of diffraction patterns are acquired for each sample rotation step. The reconstruction starts with the identification of 2D grain morphologies, using dark‐field images generated with diffraction spots. Similar contrasts are grouped using the normalized cross‐correlation. Diffraction spots belong to one grain are sorted into one diffraction pattern. Electron diffraction pattern indexing is achieved by a combination of diffraction peak search and peak indexing using both length and angle information. The tomographic reconstruction of the grain is performed using the algebraic reconstruction technique. We apply prior conditions concerning the sample outline and the damping of scattering intensity. A smoothed isosurface is created to illustrate the grain's 3D morphology. The grain orientation is determined from the indexing results. We demonstrate the performance of 3D‐SEND on a TiN thin‐film nanocrystalline sample prepared by unbalanced magnetron sputtering. The FIB cut and lift‐out was performed perpendicular to the growth direction. The sample was milled to a tip with a diameter of 200 nm. The beam was set to 7nm in FWHM. The scanning covered a 2626 pixels area and each step is 11nm. The sample was tilted over a range of ±85° with a step of 5°. In total 23660 DPs are recorded. Figure 1 shows the reconstruction results of seven major grains and their orientations. The reconstruction result is shown in Fig. 1. The spatial resolution of this technique is ultimately limited by the electron probe size under the column approximation. For a JEOL 2100 TEM, we can form a probe with a FWHM of 2.3 nm using a 10 um condenser aperture in the CBD mode with alpha = 1. Compared with the alternative technique 3D‐OMiTEM, 7 3D‐SEND has a better diffraction pattern resolution, a wider sample rotation range and a much lower electron dose. Our approach also grants a combinative study with other techniques such as atom‐probe tomography and in‐situ deformation. In the future, 3D‐SEND may potentially be improved for the five‐parameter characterization of grain boundaries.

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Recent Progress on Titanium Sesquioxide: Fabrication, Properties, and Applications

Zhu

Wang

et al. 2022

Adv Funct Materials

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Titanium sesquioxide (Ti2O3) is drawing broad attention due to its fascinating physical properties and promising applications in the fields of energy, biomedicine, and electronics, among others. Its richness is due mainly to the strongly correlated 3d1 electrons on the Ti3+ sites. In stark contrast to titanium dioxide (TiO2), Ti2O3 has an ultra‐narrow bandgap (≈0.1 eV) at room temperature, resulting from strong correlation among the 3d1 electrons. Distinct electrical and optical properties are introduced in Ti2O3, accompanied with varied intriguing applications. Remarkable photothermal conversion, infrared photodetection, and electrocatalytic properties have been reported and explored in the past few years. Based on its unique and excellent properties, Ti2O3 has been utilized in seawater desalination, electrocatalytic water splitting, cancer therapy, hydrogen production, mid‐infrared photodetection, nitrogen fixation, Li‐ion batteries, etc. Herein, the fabrication, structural and electronic properties of Ti2O3 are comprehensively introduced, with a focused summary of recent research progress on its applications. Finally, current challenges, opportunities, and future perspectives of Ti2O3 are discussed.

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Direct Imaging of Nanoscale Phase Separation inLa0.55Ca0.45MnO3: Relationship to Colossal Magnetoresistance

Cited by 128 publications

References 31 publications

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Three‐dimensional nanostructure determination from large diffraction dataset

Recent Progress on Titanium Sesquioxide: Fabrication, Properties, and Applications

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