2008
DOI: 10.1103/physrevlett.100.186601
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Direct Evidence for Delocalization of Charge Carriers at the Fermi Level in a Doped Conducting Polymer

Abstract: The infrared absorption spectrum of the polaron charges at the Fermi level EF in a heavily p-doped conducting poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonic acid) film has been measured using interferogram-modulated Fourier-transform charge-modulation spectroscopy. The spectrum indicates softer phonons and weaker electron-phonon coupling riding on a strongly redshifted Drude-like electronic transition, different from the population-averaged "bulk" spectrum. This provides direct evidence that the EF hole… Show more

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Cited by 16 publications
(9 citation statements)
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“…polymers -polyacetylene [45], polyaniline [46], polythiophenes [47,48,49,50], poly-p-phenylene sulfide [51,52] and recently in PEDOT [53]. Normally, the mobility enhancement at higher energy has been associated with insulator-metal transition via the generation of metallic bands by polarons and bipolarons [54].…”
Section: Accepted Manuscriptmentioning
confidence: 99%
“…polymers -polyacetylene [45], polyaniline [46], polythiophenes [47,48,49,50], poly-p-phenylene sulfide [51,52] and recently in PEDOT [53]. Normally, the mobility enhancement at higher energy has been associated with insulator-metal transition via the generation of metallic bands by polarons and bipolarons [54].…”
Section: Accepted Manuscriptmentioning
confidence: 99%
“…Similarly, early research on holes and electrons in conjugated polymers discovered vibrational absorption by 'IR active' molecular vibrations [5][6][7][8][9] . Extensive research on these 'IRAV' bands and Raman scattering in solid films of polymers and their ions [10][11][12][13][14][15][16][17] produced insight on the natures of the species and fascinating behaviour including possibly large intensities and Fano-like interferences. These are plausibly strong, but absolute intensities were not determined.…”
mentioning
confidence: 99%
“…Biasing voltage 4 V is mainly used; layer thickness 82.3 nm leads to the electric field strength 5.18 10 5 V/cm. Low charge carrier density (see below) and absence of permanent dipoles in the systems results in ohmic regime as shown in (Grell, 2005, Zhuo et al, 2008.…”
Section: The Macroscopic Charge Transport Modelingmentioning
confidence: 95%